Electron Microscopy

Read user reviews, compare products and contact manufacturers of Electron Microscopy products, including scanning, transmission and microprobe electron microscopy on SelectScience.

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Electron Microscopes (54)

Electron Microscopy Accessories (42)



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8500 Field Emission Scanning Electron Microscope (FE-S...  
Agilent Technologies

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The Agilent 8500 FE-SEM is a compact system that offers researchers a field emission scanning electron microscope (FE-SEM) right in their own laboratory. The innovative 8500 has been...
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ATLAS  
Carl Zeiss Microscopy

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Large area imaging for SEM, FE-SEM & FIB-SEM ATLAS combines a 16 bit scan generator and dual super-sampling signal acquisition hardware with image processing and control software for...
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ATLAS 3D  
Carl Zeiss Microscopy

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Large area imaging for SEM, FE-SEM & FIB-SEM ATLAS 3D is a package of hard- and software specifically designed for FIB nanotomography. You automatically create a 3D data stack at a...
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AURIGA  
Carl Zeiss Microscopy

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AURIGA, the CrossBeam System combines the 3D imaging and analysis performance of the GEMINI e-Beam column with the ability of a FIB for material processing and sample preparation on a...
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AURIGA Compact  
Carl Zeiss Microscopy

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Enter the 3D Nano-World with CrossBeam Technology AURIGA Compact is your FIB-SEM to enter the world of 3D nanotomography. Profit from the proven Carl Zeiss CrossBeam technology. Combine...
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AURIGA Laser  
Carl Zeiss Microscopy

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Large-scale material removal and far-reaching analysis: fast, flexible, and integrated. AURIGA Laser combines an electron microscope with extremely fast material removal and precise...
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EVO HD  
Carl Zeiss Microscopy

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High performance, total flexibility EVO HD delivers a groundbreaking increase in resolution over conventional SEM. EVO HD introduces high definition into conventional scanning...
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EVO LS  
Carl Zeiss Microscopy

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High performance, total flexibility EVO LS is the ideal SEM for the Life Science community, an arena that throws up difficult imaging challenges on a regular basis. EVO LS is a true...
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EVO MA  
Carl Zeiss Microscopy

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High performance, total flexibility The EVO MA (Materials Analysis) series of scanning electron microscopes are an indispensable tool for every application area in materials analysis.
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JetSCAN  
Carl Zeiss Microscopy

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JetSCAN: The Portable SEM for Dedicated Aircraft Engine Health Monitoring Combining powerful data interpretation and risk assessment tools within a single turnkey unit JetSCAN...
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MERLIN Compact  
Carl Zeiss Microscopy

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From Imaging to Your Complete Lab: Analytical Power for the Sub-Nanometer World Acquire images within seconds. Achieve atomic resolution. And measure and analyze surfaces entirely in...
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MERLIN for Life Sciences  
Carl Zeiss Microscopy

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Highest Beam Current in a Nanometer Size Spot Based on the new GEMINI II column and the ZEISS Complete Detection System, MERLIN is the ideal solution for complete image analysis and...
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MERLIN for Materials  
Carl Zeiss Microscopy

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From Imaging to Your Complete Lab: Analytical Power for the Sub-Nanometer World Acquire images within seconds. Achieve atomic resolution. And measure and analyze surfaces entirely in...
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ORION NanoFab  
Carl Zeiss Microscopy

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Your 3-in-1 Multibeam Ion Microscope for Sub-10nm Nanostructuring With ORION NanoFab you profit from the only system in the world that covers the complete range of micromachining to...
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ParticleSCAN VP  
Carl Zeiss Microscopy

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ParticleSCAN VP: A New Dimension in Process Control ParticleSCAN VP is an exciting addition to the Carl Zeiss portfolio of scanning electron microscopes (SEM). ParticleSCAN has been...
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Shuttle & Find for Life Sciences  
Carl Zeiss Microscopy

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Shuttle & Find for Life Sciences - Bridging the Micro and Nano Worlds Carl Zeiss presents the first easy-to-use, highly productive workflow from a light to an electron microscope and...
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Shuttle & Find for Material Analysis  
Carl Zeiss Microscopy

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Bridge the Gap between Light and Electron Microscopy Precisely Locate Regions of Interest – in Minutes Electron beam lithography (EBL) is the key method used to fabricate functional...
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SIGMA  
Carl Zeiss Microscopy

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Your FE-SEM for Nanoscale Analytics The SIGMA Series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy. Equipped with the GEMINI column...
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SIGMA VP  

5 out of 5


Carl Zeiss Microscopy

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Field Emission-SEM for advanced analytical microscopy The SIGMA series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy with the high...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

SmartSEM  
Carl Zeiss Microscopy

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Use SmartSEM to fully control all operational parameters SmartSEM is your software solution for SEM, FE-SEM and FIB-SEM. Choose between different operating modes for the GUI depending...
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ZEMAS  
Carl Zeiss Microscopy

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ZEISS Electron Microscopy Application Software for TEM With ZEMAS software you easily acquire and analyse data with ZEISS LIBRA series transmission electron microscopes. Profit from...
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Embedding Medium ERL-4221D  
AMS Biotechnology

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Embedding Medium ERL-4221D
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ASPEX EXplorer™  

4 out of 5


ASPEX, LLC

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The Only Integrated SEM/EDX System Now in its third generation, the ASPEX EXplorer is a scanning electron microscope that is designed for the automated imaging and elemental analysis of...
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  • Ease of use 4 out of 5
  • After sales service 3 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

Imaris Measurement Pro  
Bitplane AG (Part of the Andor Group)

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Because Your Image Is More Than A Pretty Picture Imaris MeasurementPro enables researchers to extract critical statistical parameters from their microscopy images thus allowing for the...
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ImarisTrack  
Bitplane AG (Part of the Andor Group)

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Discover the Meaning of Motion ImarisTrack is the most powerful commercially available tracking program that rises to the challenge of monitoring temporal changes in biological systems...
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1020 Plasma Cleaner  

4 out of 5


E.A. Fischione Instrumental Inc.

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For optimal imaging and microanalysis in electron microscopy, it is imperative to have a clean, well-prepared specimen. This is especially true for many modern electron microscopes, which...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Automatic Twin-Jet Electropolisher  
E.A. Fischione Instrumental Inc.

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High-quality thin foils for TEM Electrolytic thinning of conductive materials is an effective method of quickly producing specimens for transmission electron microscopy (TEM) without any...
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Model 1040 NanoMill® TEM specimen preparation system  
E.A. Fischione Instrumental Inc.

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Revolutionary ultra-low-energy, concentrated ion beam Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens...
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Model 190 Cryo-Can for SEM  
E.A. Fischione Instrumental Inc.

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Provides clean environment for SEM The Cryo-Can provides a clean environment for SEM sample imaging and analysis. It helps eliminate chamber contamination resulting from sample...
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Model 2020 Advanced Tomography Holder  

4 out of 5


E.A. Fischione Instrumental Inc.

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Ideal for room temperature electron tomography High tilt in narrow gap pole pieces Optimized specimen retention Extended field of view Easy, accurate specimen...
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  • Ease of use 3 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Model 3000 Annular Dark Field Detector  
E.A. Fischione Instrumental Inc.

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High-resolution STEM imaging The Model 3000 Annular Dark Field (ADF) Detector is ideal for high-resolution scanning transmission electron microscopy (STEM) imaging. It allows...
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PP3010T Cryo-SEM Preparation System  
Electron Microscopy Sciences

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The PP3010T is a highly automated, easy to use, column-mounted, gas-cooled cryo preparation system suitable for most makes and models of SEM, FE-SEM and FIB/SEM. The PP3010T has all the...
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QUANTIFOIL® – Holey Carbon Films  

4 out of 5


Electron Microscopy Sciences

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QUANTIFOIL® is a perforated support foil with pre-defined hole size, shape and arrangement. It has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS)...
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  • Ease of use 5 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Helios NanoLab™ DualBeam™  

4 out of 5


FEI Company

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Imaging, analysis and control of matter at the nanoscale — keys to future research and development — are routine with the Helios NanoLab™ DualBeam™ . This SEM/FIB combines the most advanced...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 3 out of 5

4 review(s) of this product / read all

Inspect™ Scanning Electron Microscope  

4 out of 5


FEI Company

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With advanced chamber vacuum technology, the Inspect™ line of scanning electron microscopes (SEM) builds on FEI’s world-class electron optics and sample throughput technologies. When...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Magellan XHR Scanning Electron Microscope  

5 out of 5


FEI Company

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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

Phenom Desktop Scanning Electron Microscope  

4 out of 5


FEI Company

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The world's first personal electron microscope. Why wait? Do it yourself. 20 to 24,000X in 30 seconds. Phenom is a high resolution desktop imaging tool with an optical camera for...
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  • Ease of use 4 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

3 review(s) of this product / read all

Quanta™ Scanning Electron Microscope  

5 out of 5


FEI Company

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The FEI Quanta™ line includes six variable-pressure and environmental scanning electron microscopes (ESEM™) and two DualBeam™ systems, all of which can accommodate multiple sample and...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

10 review(s) of this product / read all

Tecnai with iCorr - A Fully Integrated Correlative Sol...  
FEI Company

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FEI’s fast, accurate and automated solution for correlative light and electron microscopy, Tecnai with iCorr is the first integrated light and electron microscope. Combining a fluorescence...
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Tecnai™ Transmission Electron Microscope  

4 out of 5


FEI Company

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The FEI Tecnai™ transmission electron microscopes (TEMs) are designed to offer a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the...
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  • Ease of use 4 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

8 review(s) of this product / read all

Titan™ Transmission Electron Microscope  

4 out of 5


FEI Company

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Since its introduction in 2005, the Titan's superior product design and proven ability to deliver ground-breaking results have made it the preferred scanning/transmission electron...
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  • Ease of use 4 out of 5
  • After sales service 3 out of 5
  • Value for money 3 out of 5

6 review(s) of this product / read all

695 Precision Ion Polishing System (PIPS™ II)  

4 out of 5


Gatan Inc.

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The Precision Ion Polishing System II (PIPS™II) is a revolutionary enhancement of the PIPS™ Ion Mill System which has defined the standard for TEM sample preparation for 20 years. The...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

Gatan Microscopy Suite® 2.0  
Gatan Inc.

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Gatan Microscopy Suite® 2.0 is the latest version of the leading application for electron microscopy data acquisition and analysis. This new version of the Gatan Microscopy Suite® (GMS)...
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TEM AutoTune™  
Gatan Inc.

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TEM AutoTune™ software package greatly simplifies the tasks of tuning a TEM (transmission electron microscope). This fully automated software package features automatic adjustment of...
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Analytical TableTop Microscope TM3000  

4 out of 5


Hitachi High Technologies America, Inc.

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It's simplicity enables all users, even those new to Electron Microscopy (EM), to image their samples and to obtain high quality, high resolution images within minutes. No special sample...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

H-9500, high performance TEM  
Hitachi High Technologies America, Inc.

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The H-9500 is a high performance TEM featuring a single crystal LaB6 electron source. This allows 0.102 nm crystal lattice resolution and 0.18 nm point to point to be achieved. The...
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HD-2700 Cs Corrected STEM  
Hitachi High Technologies America, Inc.

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The HD-2700 is the top-of-the-range STEM featuring optional spherical aberration correction developed in collaboration with CEOS GmbH ot offer significantly improved resolution and...
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HF-3300 300 kV FE TEM  
Hitachi High Technologies America, Inc.

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The HF-3300 300 kV FE TEM is a powerful analytical and high resolution TEM/STEM with inherent high beam brightness, high coherence, high energy resolution, and Hitachi unique functions! ...
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Hitachi VP-SEM SU1510  
Hitachi High Technologies America, Inc.

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Hitachi VP-SEM SU1510 - Top performance in very compact size The new Hitachi SU1510 VP-SEM combines the high-performance electron optics of the S-3400N and S-3700N with an ultra-compact...
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HT7700 120 kV Automated TEM  
Hitachi High Technologies America, Inc.

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Hitachi offers the sleek HT7700 for maximum performance and productivity. The radical design incorporates the ergonomics and user friendliness of a SEM with advanced automation,...
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IM4000 Ion Milling System  
Hitachi High Technologies America, Inc.

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The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new...
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NB5000 nanoDUE'T FIB-SEM  
Hitachi High Technologies America, Inc.

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The Hitachi NB5000 FIB-SEM integrates a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM. Like all our products, all components have been designed with...
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S-3400N Fully Automated VP SEM  

5 out of 5


Hitachi High Technologies America, Inc.

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The S-3400N is the World Class Variable Pressure SEM The S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment. The...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

S-3700N Ultra Large VP-SEM  
Hitachi High Technologies America, Inc.

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The S-3700N features an ultra large specimen chamber and stage to allow observation of specimens at diameters up to 300mm. Hitachi Variable Pressure SEM (VP-SEM) series have been received...
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SU3500 Premium VP-SEM  
Hitachi High Technologies America, Inc.

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The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive...
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SU6600 Analytical VP FE-SEM  

4 out of 5


Hitachi High Technologies America, Inc.

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The SU6600 is Hitachi's latest high resolution analytical field emission SEM with Variable Pressure technology allowing observation and analysis of any type of wet, oily or dirty sample.
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  • Ease of use 4 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

SU-70 UHR Schottky (Analytical) FE-SEM  
Hitachi High Technologies America, Inc.

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SU8000 Series UHR Cold-Emission FE-SEM  
Hitachi High Technologies America, Inc.

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The SU8000 Series is Hitachi's latest product family of ultra-high performance, semi-in-lens SEM with cold-field emission. The series was developed in response to the growing demand...
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SU9000 UHR FE-SEM  
Hitachi High Technologies America, Inc.

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The SU9000 Ultra High Resolution FE-SEM is Hitachi's new premium UHR FE-SEM. It features unique electron optics, with the sample positioned inside a gap of the split objective lens pole...
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ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM  
Hitachi High Technologies America, Inc.

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Sample surfaces are inevitably coated with hydrocarbon contamination due to sample preparation or from storage. The ZONE desktop sample cleaner/desiccator gently removes contaminations to...
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Ultra-high Resolution Scanning Electron Microscope S-5...  

5 out of 5


Hitachi High-Technologies Corp (Microscopy)

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Extending the capabilities of the successful S-900 and S-5000 family of in-lense SEMs, the Hitachi S-5500 cold field emission scanning electron microscope sets a new standard for ultra-high...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

Cross Section Polisher II  
JEOL USA

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Ion beam cross section polisher with real time process monitoring. • CCD zoom camera (20 to 100x) for real time monitoring of the milling process • CCD camera incorporated in the stage...
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JEM-1400 Transmission Electron Microscope  

4 out of 5


JEOL USA

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The JEM-1400 is a high performance, high contrast, 120kV TEM with excellent imaging and analytical capabilities in one compact, easy-to-use instrument. With an acceleration voltage of 40 to...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 5 out of 5

2 review(s) of this product / read all

JEM-2100F Transmission Electron Microscope  

4 out of 5


JEOL USA

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The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

9 review(s) of this product / read all

JEM-2200FS Transmission Electron Microscope  

4 out of 5


JEOL USA

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The new JEM-2200FS combines a 200kV field emission gun (FEG) and in in-column energy filter (Omega Filter) to produce a high-end, optimally configured TEM for energy filtered imagery. ...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

4 review(s) of this product / read all

JEM-ARM200F STEM  

5 out of 5


JEOL USA

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The JEM-ARM200F, incorporating a spherical aberration corrector for electron optic system as standard, has achieved a scanning transmission image (STEM-HAADF) resolution of 0.08 nm, the...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

JIB-4000 High Throughput FIB  
JEOL USA

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The JIB-4000 is a focused ion beam sample milling system used for preparation of STEM/TEM samples and fabrication of cross section samples for SEM imaging. It is especially effective for...
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JIB-4501 MultiBeam SEM-FIB  
JEOL USA

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The JIB-4501 is a multi beam SEM-FIB system capable of surface/internal 3D imaging and analysis in a single unit. Featuring an optimum design, the system supports a complete operation from...
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JIB-4601F Multibeam System  
JEOL USA

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All in one tool - Various applications are offered with one instrument: • Optimum-geometry specimen chamber for all functions of FIB milling, SEM imaging, and EDS/EBSD analyses •...
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JSM-6490LV Scanning Electron Microscope  

4 out of 5


JEOL USA

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The JSM-6490LV is a high-performance, scanning electron microscope with a high resolution of 3.0nm. The low vacuum mode (which can be accessed by the click of a mouse), allows for...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

3 review(s) of this product / read all

JSM-6510LV Scanning Electron Microscope  
JEOL USA

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JSM-6510LV Scanning Electron Microscope - World’s most widely-used family of SEMs!   The JEOL JSM-6510LV low vacuum SEM is a high-performance, low cost, scanning electron...
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JSM-6610LV Scanning Electron Microscope  
JEOL USA

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JSM-6610LV Scanning Electron Microscope - World’s most widely-used family of SEMs! The JEOL JSM-6610LV low vacuum SEM is a high-performance scanning electron microscope for fast...
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JSM-7100F Scanning Electron Microscope  

5 out of 5


JEOL USA

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The JSM-7100F, Thermal Field Emission SEM, is the ideal platform for demanding analytical applications as well as those requiring high resolution and ease-of-use. The JSM-7001F has a large,...
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  • Ease of use 4 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

JSM-7500F Scanning Electron Microscope  

4 out of 5


JEOL USA

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The JSM-7500F is an analytical Field Emission SEM featuring enhanced performance, ease of operation, and energy efficiency. The JSM-7500F offers the highest resolution at the lowest kV...
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  • Ease of use 3 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

EM CPD300  

5 out of 5


Leica Microsystems

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The drying of biological specimens such as pollen, tissue, plants, insects, as well as industrial samples, for example MEMS (Micro Electro Mechanical Systems) for SEM analysis can be...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Ion Beam Slope Cutter Leica EM TIC 3X  
Leica Microsystems

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chieving high quality cross-sections of almost any material, revealing the internal structures of the sample with scarcely any deformation or damage was never before more convenient than...
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Leica EM AMW - Tissue Processor for Electron Microscopy  
Leica Microsystems

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With minimal user interface, rapidly process, embed, and polymerize specimens into resin with the Leica EM AMW’s unique, highly automated system. The patented combination of microwave...
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Leica EM FC7 - Cryochamber  
Leica Microsystems

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Change your Ultramicrotome Leica EM UC6 or Leica EM UC7 to a Cryoultramicrotome within minutes by mounting the Cryochamber Leica EM FC7 and prepare your cryo-sections ( -15° to -185°C) for...
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Leica EM GP  

5 out of 5


Leica Microsystems

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For the preparation of vitrified fluid samples or extremely thin samples for cryo-TEM, including biological suspensions and industrial emulsions in both, aqueous and inorganic solvents. ...
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  • Ease of use 4 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

Leica EM KMR3 - Glass Knifemaker  
Leica Microsystems

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Perfect Glass Knives for perfect ultrathin sections for EM and LM applications The balanced break method of the Leica EM KMR3 ensures perfect glass knives in three thicknesses 6,4 mm, 8...
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Leica EM MED020 - Modular High Vacuum Coating System  
Leica Microsystems

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The Leica EM MED020 is a precision high vacuum coating system for sputtering, carbon thread, carbon rod, top down and bottom up thermal resistance and dual electron beam evaporation. ...
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Leica EM SPF - Self Pressurised Freezer  
Leica Microsystems

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Are you looking for an alternative cryo-fixation method to freeze your biological specimens such as cells, free-living bacteria, yeast cells, unicellular organisms etc. in their native...
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Leica EM TP - Automated Routine Tissue Processor  
Leica Microsystems

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The innovative Leica EM TP is the first tissue processor designed for EM and LM resin processing, that features a heating/cooling system with pre-heat and pre-cool capabilities to maintain...
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Leica EM UC7 - Ultramicrotome  
Leica Microsystems

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The Ultramicrotome Leica EM UC7 provides easy preparation of semi- and ultrathin sections as well as perfect, smooth surfaces of biological and industrial samples for TEM, SEM, AFM and LM...
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EM ACE200 Low Vacuum Coater  
Leica Microsystems

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Producing homogenous and conductive metal or carbon coatings for SEM and TEM analysis was never before more convenient than with the Leica EM ACE200 coating system. Configured as a...
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EM ACE600 High Vacuum Coater  
Leica Microsystems

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Your choice for highest resolution for TEM and FE-SEM analysis. The Leica EM ACE600 is THE perfect versatile high vacuum film deposition system designed to produce very thin, fine-grained...
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EM VCT100 Vacuum Cryo Transfer System  
Leica Microsystems

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The Leica EM VCT100 is a contamination-free cryo transfer system which cross-links preparation units with various analysis systems via a transfer shuttle connected to a load-lock. Samples...
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NeoScope Benchtop SEM  
Nikon Instruments Europe

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The NeoScope benchtop SEM economically complements both optical microscopes and traditional SEMs. The NeoScope makes it easy to obtain high magnification images with high resolution...
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3D EDS Analysis  
Oxford Instruments Inc.

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Overview • Automated, FIB milling is followed by EDS X-ray map acquisition for each slice • Fast, data collection uses unique large area X-MaxN SDD • Complete, collection of the...
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AZtecEnergy - EDS Software  
Oxford Instruments Inc.

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AZtecEnergy will change the way you collect, process and view EDS data. Whether novice or expect, you’ll gather more accurate results, see everything in stunning high resolution, and finish...
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X-act - 10mm2 SDD Detector  
Oxford Instruments Inc.

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x-act incorporates 40 years of Oxford Instruments’ expertise,and is backed up by worldwide sales, service and customer support specialists. Overview • Detects elements from Be to Pu ...
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X-Max SDD Detector  

4 out of 5


Oxford Instruments Inc.

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X-MaxN comes in a range of detector sizes, from 20 mm2 for microanalysis up to an astounding 150 mm2 for advanced nanoanalysis. The latter is the largest SDD in the market and delivers more...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

108 Auto Sputter Coater  
Ted Pella Inc.

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108 Auto Sputter Coater - ideal for routine sample preparation for scanning electron microscopy The Ted Pella 108 Auto Sputter Coater is ideally suited for automated high quality...
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PELCO easiGlow™ Glow Discharge Cleaning System  

5 out of 5


Ted Pella Inc.

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For one of the most common glow discharge applications, making TEM support films or grids hydrophilic using air, the PELCO easiGlow™ uses an automated and quick cycle with fully selectable...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

PELCO® STEM Imaging Holder  
Ted Pella Inc.

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The PELCO® STEM imaging holder enables STEM imaging in the SEM by using the standard Everhart-Thornley SE detector in the SEM chamber. The standard 3mm TEM grid is placed in the grid holder...
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EBSD QuasOr  
Thermo Fisher Scientific

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Thermo Scientific QuasOr, the no compromise EBSD. Electron Backscatter Diffraction (EBSD) enables nanostructural analysis in the electron microscope by characterizing the crystalline...
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