Electron Microscopy

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Helios NanoLab 460F1 - DualBeam

FEI Company



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Helios NanoLab 460HP - DualBeam

FEI Company



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Helios NanoLab 1200AT - DualBeam

FEI Company



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Vion Plasmsa - Focused Ion Beam

FEI Company



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V400 ACE - Focused Ion Beam

FEI Company



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SU3500 Premium VP-SEM

Hitachi High Technologies America, Inc.



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H-9500, high performance TEM

Hitachi High Technologies America, Inc.



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Hitachi VP-SEM SU1510

Hitachi High Technologies America, Inc.



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108 Auto Sputter Coater

Ted Pella Inc.



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JSM-6610LV Scanning Electron Microscope

JEOL USA



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JSM-6510LV Scanning Electron Microscope

JEOL USA



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Imaris Measurement Pro

Bitplane AG (Part of the Andor Group)



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ImarisTrack

Bitplane AG (Part of the Andor Group)



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Tecnai with iCorr - A Fully Integrated Correlative Solution

FEI Company



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CorrSight

FEI Company



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S-3700N Ultra Large VP-SEM

Hitachi High Technologies America, Inc.



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HT7700 120 kV Automated TEM

Hitachi High Technologies America, Inc.



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HD-2700 Cs Corrected STEM

Hitachi High Technologies America, Inc.



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HF-3300 300 kV FE TEM

Hitachi High Technologies America, Inc.



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SU8000 Series UHR Cold-Emission FE-SEM

Hitachi High Technologies America, Inc.


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NB5000 nanoDUE'T FIB-SEM

Hitachi High Technologies America, Inc.



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IM4000 Ion Milling System

Hitachi High Technologies America, Inc.



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ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM

Hitachi High Technologies America, Inc.


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SU9000 UHR FE-SEM

Hitachi High Technologies America, Inc.



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Leica EM SPF - Self Pressurised Freezer

Leica Microsystems



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