Electron Microscopy

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ZEISS ORION NanoFab

ZEISS Microscopy



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ZEISS Crossbeam FIB-SEM

ZEISS Microscopy



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ZEISS Crossbeam 340 and Crossbeam 540

ZEISS Microscopy



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GeminiSEM Scanning Electron Microscope

ZEISS Microscopy



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ZEISS Mineralogic Mining Systems

ZEISS Microscopy



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8500 Field Emission Scanning Electron Microscope (FE-SEM)

Agilent Technologies



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Titan Halo

FEI Company



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RISE Microscopy - Correlative Raman Imaging and Scanning Electron Microscopy (Raman-SEM)

WITec GmbH



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Avizo® Fire

FEI Company



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QEMSCAN - Scanning Electron Microscope

FEI Company



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MLA

FEI Company



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Verios (XHR) - Scanning Electron Microscope

FEI Company



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NovaNano - Scanning Electron Microscope

FEI Company


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Aspex Extreme

FEI Company



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Aspex Explorer

FEI Company



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Aspex Express

FEI Company



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Teneo VS SEM

FEI Company



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Leica EM Cryo CLEM

Leica Microsystems



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Model 3000 Annular Dark Field Detector

E.A. Fischione Instrumental Inc.



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Model 190 Cryo-Can for SEM

E.A. Fischione Instrumental Inc.



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Model 1040 NanoMill® TEM specimen preparation system

E.A. Fischione Instrumental Inc.



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Automatic Twin-Jet Electropolisher

E.A. Fischione Instrumental Inc.



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AZtecEnergy - EDS Software

Oxford Instruments Inc.



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X-act - 10mm2 SDD Detector

Oxford Instruments Inc.



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3D EDS Analysis

Oxford Instruments Inc.



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