Electron Microscopy

Read user reviews, compare products and contact manufacturers of Electron Microscopy products, including scanning, transmission and microprobe electron microscopy on SelectScience.

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Aspex Explorer  
FEI Company

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The Aspex Explorer is a designed for the automated imaging and elemental analysis of a wide spectrum of surfaces and particulate. The Aspex Explorer seamlessly provides high imaging, rapid...
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Aspex Express  
FEI Company

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The Aspex Express is the fastest integrated bench-top SEM solution on the market today.
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Aspex Extreme  
FEI Company

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The Aspex Extreme is an elemental analyzer that provides the power of a competitive SEM but in a self-contained package small enough to fit through the hatches of an aircraft carrier.
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Avizo® Fire  
FEI Company

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3D Analysis Software for Materials Science. Avizo Fire offers a broad range of software tools for obtaining and visualizing advanced qualitative and quantitative information on...
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Certus 3D - Dualbeam  
FEI Company

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The Certus-3D shortens time to market by enabling critical engineering and development faster than other electron and/or ion-beam technologies. With its TEMLink™ 100 option, the...
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CLM-3D - DualBeam  
FEI Company

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The CLM-3D delivers three-dimensional metrology information to meet the rapid prototyping and process control needs of modern semiconductor manufacturers. Combining an electron...
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CorrSight   
FEI Company

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FEI's CorrSight optimizes the major steps within the correlative workflow. To meet specific imaging needs, users can configure a fully automated correlative imaging system dedicated to...
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ExSolve Wafer TEM Prep  
FEI Company

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The ExSolve WTP system is an automated, high-throughput sample preparation system that can prepare site-specific, 20 nm thick lamellae on whole wafers up to 300mm in diameter. It is part...
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Helios NanoLab 1200AT - DualBeam  
FEI Company

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The Helios NanoLab 1200AT can create site-specific TEM samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter. An optional Automated...
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Helios NanoLab 460F1 - DualBeam  
FEI Company

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The Helios Nanolab 460F1 combines the industry leading, highest resolution Elstar+UC SEM with the most advanced Tomahawk FIB for best-in-class imaging and milling performance. 
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Helios NanoLab 460HP - DualBeam  
FEI Company

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The Helios NanoLab series is the world’s most advanced DualBeam platform for imaging, analysis, and TEM sample preparation in semiconductor failure analysis, process development and process...
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Helios NanoLab™ - DualBeam™   

4 out of 5


FEI Company

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The Helios NanoLab™ 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeam™ platform,...
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  • Ease of use 4 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

4 review(s) of this product / Read All

Helios NanoLab™ 660 - DualBeam  
FEI Company

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The Helios NanoLab™ 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeam™...
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Inspect™ - Scanning Electron Microscope   

4 out of 5


FEI Company

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With advanced chamber vacuum technology, the Inspect™ line of scanning electron microscopes (SEM) builds on FEI’s world-class electron optics and sample throughput technologies. When...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / Read All

Magellan XHR Scanning Electron Microscope  

5 out of 5


FEI Company

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Discover the world of Extreme High Resolution SEM The Verios is the second generation of FEI's leading XHR SEM family, offering accurate imaging with sub-nanometer resolution over the...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

2 review(s) of this product / Read All

Metrios - Transmission Electron Microscope  

5 out of 5


FEI Company

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The Metrios system is the first TEM dedicated to providing the fast, precise measurements that semiconductor manufacturers need to develop and control their wafer fabrication processes. ...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / Read All

MLA  
FEI Company

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he MLA (an acronym for Mineral Liberation Analyzer) is an automated mineral analysis system that can identify minerals in polished sections of drill core, particulate, or lump materials,...
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NovaNano - Scanning Electron Microscope  
FEI Company

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The Nova NanoSEM™ scanning electron microscope delivers best in class imaging and analytical performance in a single, easy-to-use instrument. Specifically designed to streamline...
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QEMSCAN - Scanning Electron Microscope  
FEI Company

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QEMSCAN® is a fully automated, non-destructive, micro-analysis system that provides rapid, statistically reliable and repeatable, mineralogical, petrographic and metallurgical data,...
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Quanta™ - Scanning Electron Microscope   

5 out of 5


FEI Company

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The FEI Quanta™ line includes six variable-pressure and environmental scanning electron microscopes (ESEM™) and two DualBeam™ systems, all of which can accommodate multiple sample and...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

16 review(s) of this product / Read All

Scios - DualBeam™  
FEI Company

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FEI Scios™ is an ultra-high-resolution analytical DualBeam™ system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material. With...
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Talos - Transmission Electron Microscope  
FEI Company

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Talos™ is a new generation in TEM, built to deliver rapid access to 2D and 3D data so that you can concentrate on discovery. With configurations for materials research and life sciences...
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Tecnai - Transmission Electron Microscope   

4 out of 5


FEI Company

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The FEI Tecnai™  transmission electron microscopes are designed to offer a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

8 review(s) of this product / Read All

Tecnai Arctica - Transmission Electron Microscope  
FEI Company

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The Tecnai Arctica is a powerful, automated high resolution electron microscope for 3D characterization of biological samples. Its revolutionary cryo-based technology easily integrates...
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Tecnai Femto UEM - Transmission Electron Microscope  
FEI Company

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Tecnai™ Femto ultrafast electron microscope (UEM) is a dedicated solution for 4D dynamic electron microscopy at the atomic scale.
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Tecnai G2 - Transmission Electron Microscope  
FEI Company

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The Tecnai G2 transmission electron microscope unifies fast, efficient and easy operation with proven reliability to serve many applications needs – from basic, rapid sample screening to...
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Tecnai iCorr - Transmission Electron Microscope  
FEI Company

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Tecnai with iCorr is unique in the way it solves the challenges related to CLEM. It's an integrated instrument in terms of hardware and software that seamlessly merges EM imaging with...
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Tecnai Osiris - Transmission Electron Microscope  
FEI Company

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he Tecnai Osiris™ is a fully digital 200 kV S/TEM system, designed to deliver revolutionary analytical performance in all imaging and analytical modes. Tecnai Osiris features the unique...
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Tecnai with iCorr - A Fully Integrated Correlative Sol...  
FEI Company

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FEI’s fast, accurate and automated solution for correlative light and electron microscopy, Tecnai with iCorr is the first integrated light and electron microscope. Combining a fluorescence...
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Teneo VS SEM  
FEI Company

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Highest quality isotropic 3D data from large sample volumes. Teneo VSTM SEM is a novel Serial Block Face Imaging solution that combines mechanical sectioning with virtual sectioning...
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Titan ETEM G2 - Transmission Electron Microscope  
FEI Company

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Environmental Transmission Electron Microscope for dynamic in situ exploration of functional nanomaterials and devices at the nanometer and atomic scale.
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Titan Halo  
FEI Company

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Based on the Titan Krios ultimate platform for biological imaging, Titan Halo combines versatility and flexibility with impressive, superior optical quality. The Titan Halo™...
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Titan Krios™ - Transmission Electron Microscope  
FEI Company

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The Titan Krios™ transmission electron microscope is tailored for use in protein and cellular imaging. Its revolutionary cryo-based technology and stability permits a full range of...
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Titan Themis - Transmission Electron Microscope  
FEI Company

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 Titan Themis TEM builds on the proven Cs corrected Titan platform to deliver the fastest time to data and the best S/TEM image quality for rapid access to crystal clear atomic scale...
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Titan™ - Transmission Electron Microscope  

4 out of 5


FEI Company

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Since its introduction in 2005, the Titan's superior product design and proven ability to deliver ground-breaking results have made it the preferred scanning/transmission electron...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

8 review(s) of this product / Read All

V400 ACE - Focused Ion Beam  
FEI Company

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The V400ACE is specifically designed to meet the challenges of advanced designs and processes: smaller geometries, higher circuit densities, exotic materials and complex interconnect...
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Verios (XHR) - Scanning Electron Microscope  
FEI Company

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The Verios is the second generation of FEI’s leading XHR (extreme high resolution) SEM family. It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for...
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Versa 3D - DualBeam™  
FEI Company

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Building on the history and success of FEI's pioneering DualBeam, low vacuum and ESEM™ expertise, FEI introduces the most versatile DualBeam instrument to date. The Versa 3D offers...
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Vion Plasmsa - Focused Ion Beam  
FEI Company

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The FEI Vion™ Plasma Focused Ion Beam System (PFIB) adds significantly more capacity to your lab, with best-in-class milling and imaging performance in a single, easy-to-use instrument. ...
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695 Precision Ion Polishing System (PIPS™ II)  

4 out of 5


Gatan Inc.

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The Precision Ion Polishing System II (PIPS™II) is a revolutionary enhancement of the PIPS™ Ion Mill System which has defined the standard for TEM sample preparation for 20 years. The...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / Read All

Analytical TableTop Microscope TM3000  

4 out of 5


Hitachi High Technologies America, Inc.

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It's simplicity enables all users, even those new to Electron Microscopy (EM), to image their samples and to obtain high quality, high resolution images within minutes. No special sample...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 5 out of 5

2 review(s) of this product / Read All

H-9500, high performance TEM  
Hitachi High Technologies America, Inc.

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The H-9500 is a high performance TEM featuring a single crystal LaB6 electron source. This allows 0.102 nm crystal lattice resolution and 0.18 nm point to point to be achieved. The...
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HD-2700 Cs Corrected STEM  
Hitachi High Technologies America, Inc.

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The HD-2700 is the top-of-the-range STEM featuring optional spherical aberration correction developed in collaboration with CEOS GmbH ot offer significantly improved resolution and...
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HF-3300 300 kV FE TEM  
Hitachi High Technologies America, Inc.

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The HF-3300 300 kV FE TEM is a powerful analytical and high resolution TEM/STEM with inherent high beam brightness, high coherence, high energy resolution, and Hitachi unique functions! ...
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Hitachi VP-SEM SU1510  
Hitachi High Technologies America, Inc.

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Hitachi VP-SEM SU1510 - Top performance in very compact size The new Hitachi SU1510 VP-SEM combines the high-performance electron optics of the S-3400N and S-3700N with an ultra-compact...
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HT7700 120 kV Automated TEM  
Hitachi High Technologies America, Inc.

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Hitachi offers the sleek HT7700 for maximum performance and productivity. The radical design incorporates the ergonomics and user friendliness of a SEM with advanced automation,...
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IM4000 Ion Milling System  
Hitachi High Technologies America, Inc.

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The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new...
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NB5000 nanoDUE'T FIB-SEM  
Hitachi High Technologies America, Inc.

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The Hitachi NB5000 FIB-SEM integrates a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM. Like all our products, all components have been designed with...
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S-3400N Fully Automated VP SEM  

5 out of 5


Hitachi High Technologies America, Inc.

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The S-3400N is the World Class Variable Pressure SEM The S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment. The...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

2 review(s) of this product / Read All

S-3700N Ultra Large VP-SEM  
Hitachi High Technologies America, Inc.

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The S-3700N features an ultra large specimen chamber and stage to allow observation of specimens at diameters up to 300mm. Hitachi Variable Pressure SEM (VP-SEM) series have been received...
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