Electron Microscopy

Read user reviews, compare products and contact manufacturers of Electron Microscopy products, including scanning, transmission and microprobe electron microscopy on SelectScience.

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Electron Microscopes (88)

Electron Microscopy Accessories (40)



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Tecnai Osiris - Transmission Electron Microscope  
FEI Company

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he Tecnai Osiris™ is a fully digital 200 kV S/TEM system, designed to deliver revolutionary analytical performance in all imaging and analytical modes. Tecnai Osiris features the unique...
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Tecnai with iCorr - A Fully Integrated Correlative Sol...  
FEI Company

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FEI’s fast, accurate and automated solution for correlative light and electron microscopy, Tecnai with iCorr is the first integrated light and electron microscope. Combining a fluorescence...
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Titan ETEM G2 - Transmission Electron Microscope  
FEI Company

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Environmental Transmission Electron Microscope for dynamic in situ exploration of functional nanomaterials and devices at the nanometer and atomic scale.
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Titan Krios™ - Transmission Electron Microscope  
FEI Company

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The Titan Krios™ transmission electron microscope is tailored for use in protein and cellular imaging. Its revolutionary cryo-based technology and stability permits a full range of...
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Titan Themis - Transmission Electron Microscope  
FEI Company

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 Titan Themis TEM builds on the proven Cs corrected Titan platform to deliver the fastest time to data and the best S/TEM image quality for rapid access to crystal clear atomic scale...
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Titan™ - Transmission Electron Microscope  

4 out of 5


FEI Company

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Since its introduction in 2005, the Titan's superior product design and proven ability to deliver ground-breaking results have made it the preferred scanning/transmission electron...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 3 out of 5

7 review(s) of this product / read all

V400 ACE - Focused Ion Beam  
FEI Company

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The V400ACE is specifically designed to meet the challenges of advanced designs and processes: smaller geometries, higher circuit densities, exotic materials and complex interconnect...
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Verios (XHR) - Scanning Electron Microscope  
FEI Company

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The Verios is the second generation of FEI’s leading XHR (extreme high resolution) SEM family. It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for...
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Versa 3D - DualBeam™  
FEI Company

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Building on the history and success of FEI's pioneering DualBeam, low vacuum and ESEM™ expertise, FEI introduces the most versatile DualBeam instrument to date. The Versa 3D offers...
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Vion Plasmsa - Focused Ion Beam  
FEI Company

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The FEI Vion™ Plasma Focused Ion Beam System (PFIB) adds significantly more capacity to your lab, with best-in-class milling and imaging performance in a single, easy-to-use instrument. ...
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ASPEX EXplorer™  

4 out of 5


ASPEX, LLC

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The Only Integrated SEM/EDX System Now in its third generation, the ASPEX EXplorer is a scanning electron microscope that is designed for the automated imaging and elemental analysis of...
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  • Ease of use 4 out of 5
  • After sales service 3 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

Imaris Measurement Pro  
Bitplane AG (Part of the Andor Group)

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Because Your Image Is More Than A Pretty Picture Imaris MeasurementPro enables researchers to extract critical statistical parameters from their microscopy images thus allowing for the...
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ImarisTrack  
Bitplane AG (Part of the Andor Group)

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Discover the Meaning of Motion ImarisTrack is the most powerful commercially available tracking program that rises to the challenge of monitoring temporal changes in biological systems...
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QUANTAX Micro-XRF  
Bruker-Nano

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QUANTAX Micro-XRF with Xtrace - Upgrading SEMs for Trace Element Analysis QUANTAX Micro-XRF with the XTrace micro-spot X-ray source adds the capabilities of a complete micro-XRF...
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QUANTAX WDS  
Bruker-Nano

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QUANTAX WDS with XSense - Ultra-Sensitive Wavelength-Dispersive Spectrometry for SEM QUANTAX WDS features the compact XSense spectrometer. This high precision instrument incorporates...
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1020 Plasma Cleaner  

4 out of 5


E.A. Fischione Instrumental Inc.

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For optimal imaging and microanalysis in electron microscopy, it is imperative to have a clean, well-prepared specimen. This is especially true for many modern electron microscopes, which...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Automatic Twin-Jet Electropolisher  
E.A. Fischione Instrumental Inc.

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High-quality thin foils for TEM Electrolytic thinning of conductive materials is an effective method of quickly producing specimens for transmission electron microscopy (TEM) without any...
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Model 1040 NanoMill® TEM specimen preparation system  
E.A. Fischione Instrumental Inc.

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Revolutionary ultra-low-energy, concentrated ion beam Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens...
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Model 190 Cryo-Can for SEM  
E.A. Fischione Instrumental Inc.

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Provides clean environment for SEM The Cryo-Can provides a clean environment for SEM sample imaging and analysis. It helps eliminate chamber contamination resulting from sample...
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Model 2020 Advanced Tomography Holder  

4 out of 5


E.A. Fischione Instrumental Inc.

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Ideal for room temperature electron tomography High tilt in narrow gap pole pieces Optimized specimen retention Extended field of view Easy, accurate specimen...
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  • Ease of use 3 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Model 3000 Annular Dark Field Detector  
E.A. Fischione Instrumental Inc.

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High-resolution STEM imaging The Model 3000 Annular Dark Field (ADF) Detector is ideal for high-resolution scanning transmission electron microscopy (STEM) imaging. It allows...
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PP3010T Cryo-SEM Preparation System  
Electron Microscopy Sciences

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The PP3010T is a highly automated, easy to use, column-mounted, gas-cooled cryo preparation system suitable for most makes and models of SEM, FE-SEM and FIB/SEM. The PP3010T has all the...
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QUANTIFOIL® – Holey Carbon Films  

4 out of 5


Electron Microscopy Sciences

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QUANTIFOIL® is a perforated support foil with pre-defined hole size, shape and arrangement. It has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS)...
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  • Ease of use 5 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

695 Precision Ion Polishing System (PIPS™ II)  

4 out of 5


Gatan Inc.

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The Precision Ion Polishing System II (PIPS™II) is a revolutionary enhancement of the PIPS™ Ion Mill System which has defined the standard for TEM sample preparation for 20 years. The...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

Gatan Microscopy Suite® 2.0  
Gatan Inc.

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Gatan Microscopy Suite® 2.0 is the latest version of the leading application for electron microscopy data acquisition and analysis. This new version of the Gatan Microscopy Suite® (GMS)...
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TEM AutoTune™  
Gatan Inc.

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TEM AutoTune™ software package greatly simplifies the tasks of tuning a TEM (transmission electron microscope). This fully automated software package features automatic adjustment of...
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Analytical TableTop Microscope TM3000  

4 out of 5


Hitachi High Technologies America, Inc.

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It's simplicity enables all users, even those new to Electron Microscopy (EM), to image their samples and to obtain high quality, high resolution images within minutes. No special sample...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

H-9500, high performance TEM  
Hitachi High Technologies America, Inc.

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The H-9500 is a high performance TEM featuring a single crystal LaB6 electron source. This allows 0.102 nm crystal lattice resolution and 0.18 nm point to point to be achieved. The...
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HD-2700 Cs Corrected STEM  
Hitachi High Technologies America, Inc.

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The HD-2700 is the top-of-the-range STEM featuring optional spherical aberration correction developed in collaboration with CEOS GmbH ot offer significantly improved resolution and...
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HF-3300 300 kV FE TEM  
Hitachi High Technologies America, Inc.

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The HF-3300 300 kV FE TEM is a powerful analytical and high resolution TEM/STEM with inherent high beam brightness, high coherence, high energy resolution, and Hitachi unique functions! ...
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Hitachi VP-SEM SU1510  
Hitachi High Technologies America, Inc.

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Hitachi VP-SEM SU1510 - Top performance in very compact size The new Hitachi SU1510 VP-SEM combines the high-performance electron optics of the S-3400N and S-3700N with an ultra-compact...
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HT7700 120 kV Automated TEM  
Hitachi High Technologies America, Inc.

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Hitachi offers the sleek HT7700 for maximum performance and productivity. The radical design incorporates the ergonomics and user friendliness of a SEM with advanced automation,...
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IM4000 Ion Milling System  
Hitachi High Technologies America, Inc.

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The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new...
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NB5000 nanoDUE'T FIB-SEM  
Hitachi High Technologies America, Inc.

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The Hitachi NB5000 FIB-SEM integrates a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM. Like all our products, all components have been designed with...
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S-3400N Fully Automated VP SEM  

5 out of 5


Hitachi High Technologies America, Inc.

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The S-3400N is the World Class Variable Pressure SEM The S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment. The...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

S-3700N Ultra Large VP-SEM  
Hitachi High Technologies America, Inc.

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The S-3700N features an ultra large specimen chamber and stage to allow observation of specimens at diameters up to 300mm. Hitachi Variable Pressure SEM (VP-SEM) series have been received...
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SU3500 Premium VP-SEM  
Hitachi High Technologies America, Inc.

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The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive...
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SU6600 Analytical VP FE-SEM  

4 out of 5


Hitachi High Technologies America, Inc.

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The SU6600 is Hitachi's latest high resolution analytical field emission SEM with Variable Pressure technology allowing observation and analysis of any type of wet, oily or dirty sample.
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  • Ease of use 4 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

SU-70 UHR Schottky (Analytical) FE-SEM  
Hitachi High Technologies America, Inc.

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SU8000 Series UHR Cold-Emission FE-SEM  
Hitachi High Technologies America, Inc.

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The SU8000 Series is Hitachi's latest product family of ultra-high performance, semi-in-lens SEM with cold-field emission. The series was developed in response to the growing demand...
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SU8200 Series CFE SEM  
Hitachi High Technologies America, Inc.

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Ultra-high Resolution Scanning Electron Microscope SU8200 Series - Innovative Cold Field Emission Gun with Unmatched Resolution and Beam Stability This novel CFE gun employs a Hitachi...
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SU9000 UHR FE-SEM  
Hitachi High Technologies America, Inc.

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The SU9000 Ultra High Resolution FE-SEM is Hitachi's new premium UHR FE-SEM. It features unique electron optics, with the sample positioned inside a gap of the split objective lens pole...
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ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM  
Hitachi High Technologies America, Inc.

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Sample surfaces are inevitably coated with hydrocarbon contamination due to sample preparation or from storage. The ZONE desktop sample cleaner/desiccator gently removes contaminations to...
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Ultra-high Resolution Scanning Electron Microscope S-5...  

5 out of 5


Hitachi High-Technologies Corp (Microscopy)

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Extending the capabilities of the successful S-900 and S-5000 family of in-lense SEMs, the Hitachi S-5500 cold field emission scanning electron microscope sets a new standard for ultra-high...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

Cross Section Polisher II  
JEOL USA

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Ion beam cross section polisher with real time process monitoring. • CCD zoom camera (20 to 100x) for real time monitoring of the milling process • CCD camera incorporated in the stage...
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JEM-1400 Transmission Electron Microscope  

4 out of 5


JEOL USA

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The JEM-1400 is a high performance, high contrast, 120kV TEM with excellent imaging and analytical capabilities in one compact, easy-to-use instrument. With an acceleration voltage of 40 to...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 5 out of 5

2 review(s) of this product / read all

JEM-2100F Transmission Electron Microscope  

4 out of 5


JEOL USA

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The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

9 review(s) of this product / read all

JEM-2200FS Transmission Electron Microscope  

4 out of 5


JEOL USA

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The new JEM-2200FS combines a 200kV field emission gun (FEG) and in in-column energy filter (Omega Filter) to produce a high-end, optimally configured TEM for energy filtered imagery. ...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

4 review(s) of this product / read all

JEM-ARM200F STEM  

5 out of 5


JEOL USA

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The JEM-ARM200F, incorporating a spherical aberration corrector for electron optic system as standard, has achieved a scanning transmission image (STEM-HAADF) resolution of 0.08 nm, the...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

JIB-4000 High Throughput FIB  
JEOL USA

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The JIB-4000 is a focused ion beam sample milling system used for preparation of STEM/TEM samples and fabrication of cross section samples for SEM imaging. It is especially effective for...
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