Electron Microscopy

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Showing 26 - 50 of 130 results

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NB5000 nanoDUE'T FIB-SEM

Hitachi High Technologies America, Inc.



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IM4000 Ion Milling System

Hitachi High Technologies America, Inc.



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ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM

Hitachi High Technologies America, Inc.


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SU9000 UHR FE-SEM

Hitachi High Technologies America, Inc.



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Model 3000 Annular Dark Field Detector

E.A. Fischione Instrumental Inc.



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Model 190 Cryo-Can for SEM

E.A. Fischione Instrumental Inc.



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Model 1040 NanoMill® TEM specimen preparation system

E.A. Fischione Instrumental Inc.



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Automatic Twin-Jet Electropolisher

E.A. Fischione Instrumental Inc.



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AZtecEnergy - EDS Software

Oxford Instruments Inc.



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X-act - 10mm2 SDD Detector

Oxford Instruments Inc.



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3D EDS Analysis

Oxford Instruments Inc.



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JIB-4501 MultiBeam SEM-FIB

JEOL USA



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JIB-4601F Multibeam System

JEOL USA



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Cross Section Polisher II

JEOL USA



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JIB-4000 High Throughput FIB

JEOL USA



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PELCO® STEM Imaging Holder

Ted Pella Inc.



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EBSD QuasOr

Thermo Fisher Scientific



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PP3010T Cryo-SEM Preparation System

Electron Microscopy Sciences



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SU8200 Series CFE SEM

Hitachi High Technologies America, Inc.



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QUANTAX WDS

Bruker-Nano



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QUANTAX Micro-XRF

Bruker-Nano



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SU3500 Premium VP-SEM

Hitachi High Technologies America, Inc.



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H-9500, high performance TEM

Hitachi High Technologies America, Inc.



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Hitachi VP-SEM SU1510

Hitachi High Technologies America, Inc.



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108 Auto Sputter Coater

Ted Pella Inc.



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