Electron Microscopy

Read user reviews, compare products and contact manufacturers of Electron Microscopy products, including scanning, transmission and microprobe electron microscopy on SelectScience.

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Electron Microscopes (91)

Electron Microscopy Accessories (39)



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8500 Field Emission Scanning Electron Microscope (FE-S...  
Agilent Technologies

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The Agilent 8500 FE-SEM is a compact system that offers researchers a field emission scanning electron microscope (FE-SEM) right in their own laboratory. The innovative 8500 has been...
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ATLAS  
ZEISS Microscopy

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Large area imaging for SEM, FE-SEM & FIB-SEM ATLAS combines a 16 bit scan generator and dual super-sampling signal acquisition hardware with image processing and control software for...
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ATLAS 3D  
ZEISS Microscopy

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Large area imaging for SEM, FE-SEM & FIB-SEM ATLAS 3D is a package of hard- and software specifically designed for FIB nanotomography. You automatically create a 3D data stack at a...
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AURIGA  
ZEISS Microscopy

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AURIGA, the CrossBeam System combines the 3D imaging and analysis performance of the GEMINI e-Beam column with the ability of a FIB for material processing and sample preparation on a...
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AURIGA Compact  
ZEISS Microscopy

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Enter the 3D Nano-World with CrossBeam Technology AURIGA Compact is your FIB-SEM to enter the world of 3D nanotomography. Profit from the proven Carl Zeiss CrossBeam technology. Combine...
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AURIGA Laser  
ZEISS Microscopy

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Large-scale material removal and far-reaching analysis: fast, flexible, and integrated. AURIGA Laser combines an electron microscope with extremely fast material removal and precise...
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Crossbeam FIB-SEM  
ZEISS Microscopy

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Speed up your tomography runs: use up to 100 nA FIB current with excellent spot profile to bridge the gap between micro- and nanopatterning. With Crossbeam you combine the imaging and...
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EVO 18 SEM  

4 out of 5


ZEISS Microscopy

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EVO 18 provides excellent quality imaging results from an analytical microscope with the capability to handle all material types EVO 18 offers Energy and Wavelength Dispersive...
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  • Ease of use 5 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

EVO HD  
ZEISS Microscopy

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High performance, total flexibility EVO HD delivers a groundbreaking increase in resolution over conventional SEM. EVO HD introduces high definition into conventional scanning...
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EVO LS  
ZEISS Microscopy

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High performance, total flexibility EVO LS is the ideal SEM for the Life Science community, an arena that throws up difficult imaging challenges on a regular basis. EVO LS is a true...
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EVO MA  
ZEISS Microscopy

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High performance, total flexibility The EVO MA (Materials Analysis) series of scanning electron microscopes are an indispensable tool for every application area in materials analysis.
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JetSCAN  
ZEISS Microscopy

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JetSCAN: The Portable SEM for Dedicated Aircraft Engine Health Monitoring Combining powerful data interpretation and risk assessment tools within a single turnkey unit JetSCAN...
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MERLIN Compact  
ZEISS Microscopy

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From Imaging to Your Complete Lab: Analytical Power for the Sub-Nanometer World Acquire images within seconds. Achieve atomic resolution. And measure and analyze surfaces entirely in...
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MERLIN for Life Sciences  
ZEISS Microscopy

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Highest Beam Current in a Nanometer Size Spot Based on the new GEMINI II column and the ZEISS Complete Detection System, MERLIN is the ideal solution for complete image analysis and...
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MERLIN for Materials  
ZEISS Microscopy

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From Imaging to Your Complete Lab: Analytical Power for the Sub-Nanometer World Acquire images within seconds. Achieve atomic resolution. And measure and analyze surfaces entirely in...
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Mineralogic Mining Systems  
ZEISS Microscopy

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Your Automated Quantitative Petrological Analyzer. Characterize minerals and achieve maximum recovery of resources. With Mineralogic Mining you use automated mineral analysis to...
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ORION NanoFab  
ZEISS Microscopy

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Your 3-in-1 Multibeam Ion Microscope for Sub-10nm Nanostructuring With ORION NanoFab you profit from the only system in the world that covers the complete range of micromachining to...
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ParticleSCAN VP  
ZEISS Microscopy

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ParticleSCAN VP: A New Dimension in Process Control ParticleSCAN VP is an exciting addition to the Carl Zeiss portfolio of scanning electron microscopes (SEM). ParticleSCAN has been...
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Shuttle & Find for Life Sciences  
ZEISS Microscopy

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Shuttle & Find for Life Sciences - Bridging the Micro and Nano Worlds Carl Zeiss presents the first easy-to-use, highly productive workflow from a light to an electron microscope and...
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Shuttle & Find for Material Analysis  
ZEISS Microscopy

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Bridge the Gap between Light and Electron Microscopy Precisely Locate Regions of Interest – in Minutes Electron beam lithography (EBL) is the key method used to fabricate functional...
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SIGMA  
ZEISS Microscopy

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Your FE-SEM for Nanoscale Analytics The SIGMA Series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy. Equipped with the GEMINI column...
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SIGMA VP  

5 out of 5


ZEISS Microscopy

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Field Emission-SEM for advanced analytical microscopy The SIGMA series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy with the high...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

SmartSEM  
ZEISS Microscopy

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Use SmartSEM to fully control all operational parameters SmartSEM is your software solution for SEM, FE-SEM and FIB-SEM. Choose between different operating modes for the GUI depending...
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ZEISS Crossbeam 340 and Crossbeam 540  
ZEISS Microscopy

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Your FIB-SEMs for Nanotomography and Nanofabrication Speed up your tomography runs: use up to 100 nA FIB current with excellent spot profile to bridge the gap between micro- and...
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ZEMAS  
ZEISS Microscopy

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ZEISS Electron Microscopy Application Software for TEM With ZEMAS software you easily acquire and analyse data with ZEISS LIBRA series transmission electron microscopes. Profit from...
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EM CPD300  

5 out of 5


Leica Microsystems

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The drying of biological specimens such as pollen, tissue, plants, insects, as well as industrial samples, for example MEMS (Micro Electro Mechanical Systems) for SEM analysis can be...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Ion Beam Slope Cutter Leica EM TIC 3X  
Leica Microsystems

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chieving high quality cross-sections of almost any material, revealing the internal structures of the sample with scarcely any deformation or damage was never before more convenient than...
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Leica EM AMW - Tissue Processor for Electron Microscopy  
Leica Microsystems

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With minimal user interface, rapidly process, embed, and polymerize specimens into resin with the Leica EM AMW’s unique, highly automated system. The patented combination of microwave...
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Leica EM FC7 - Cryochamber  
Leica Microsystems

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Change your Ultramicrotome Leica EM UC6 or Leica EM UC7 to a Cryoultramicrotome within minutes by mounting the Cryochamber Leica EM FC7 and prepare your cryo-sections ( -15° to -185°C) for...
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Leica EM GP  

5 out of 5


Leica Microsystems

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For the preparation of vitrified fluid samples or extremely thin samples for cryo-TEM, including biological suspensions and industrial emulsions in both, aqueous and inorganic solvents. ...
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  • Ease of use 4 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

Leica EM KMR3 - Glass Knifemaker  
Leica Microsystems

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Perfect Glass Knives for perfect ultrathin sections for EM and LM applications The balanced break method of the Leica EM KMR3 ensures perfect glass knives in three thicknesses 6,4 mm, 8...
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Leica EM MED020 - Modular High Vacuum Coating System  
Leica Microsystems

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The Leica EM MED020 is a precision high vacuum coating system for sputtering, carbon thread, carbon rod, top down and bottom up thermal resistance and dual electron beam evaporation. ...
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Leica EM SPF - Self Pressurised Freezer  
Leica Microsystems

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Are you looking for an alternative cryo-fixation method to freeze your biological specimens such as cells, free-living bacteria, yeast cells, unicellular organisms etc. in their native...
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Leica EM TP - Automated Routine Tissue Processor  
Leica Microsystems

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The innovative Leica EM TP is the first tissue processor designed for EM and LM resin processing, that features a heating/cooling system with pre-heat and pre-cool capabilities to maintain...
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Leica EM UC7 - Ultramicrotome  

4 out of 5


Leica Microsystems

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The Ultramicrotome Leica EM UC7 provides easy preparation of semi- and ultrathin sections as well as perfect, smooth surfaces of biological and industrial samples for TEM, SEM, AFM and LM...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

3 review(s) of this product / read all

Imaris Measurement Pro  
Bitplane AG (Part of the Andor Group)

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Because Your Image Is More Than A Pretty Picture Imaris MeasurementPro enables researchers to extract critical statistical parameters from their microscopy images thus allowing for the...
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ImarisTrack  
Bitplane AG (Part of the Andor Group)

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Discover the Meaning of Motion ImarisTrack is the most powerful commercially available tracking program that rises to the challenge of monitoring temporal changes in biological systems...
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Aspex Explorer  
FEI Company

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The Aspex Explorer is a designed for the automated imaging and elemental analysis of a wide spectrum of surfaces and particulate. The Aspex Explorer seamlessly provides high imaging, rapid...
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Aspex Express  
FEI Company

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The Aspex Express is the fastest integrated bench-top SEM solution on the market today.
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Aspex Extreme  
FEI Company

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The Aspex Extreme is an elemental analyzer that provides the power of a competitive SEM but in a self-contained package small enough to fit through the hatches of an aircraft carrier.
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Avizo® Fire  
FEI Company

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3D Analysis Software for Materials Science. Avizo Fire offers a broad range of software tools for obtaining and visualizing advanced qualitative and quantitative information on...
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Certus 3D - Dualbeam  
FEI Company

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The Certus-3D shortens time to market by enabling critical engineering and development faster than other electron and/or ion-beam technologies. With its TEMLink™ 100 option, the...
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CLM-3D - DualBeam  
FEI Company

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The CLM-3D delivers three-dimensional metrology information to meet the rapid prototyping and process control needs of modern semiconductor manufacturers. Combining an electron...
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CorrSight   
FEI Company

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FEI's CorrSight optimizes the major steps within the correlative workflow. To meet specific imaging needs, users can configure a fully automated correlative imaging system dedicated to...
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ExSolve Wafer TEM Prep  
FEI Company

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The ExSolve WTP system is an automated, high-throughput sample preparation system that can prepare site-specific, 20 nm thick lamellae on whole wafers up to 300mm in diameter. It is part...
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Helios NanoLab 1200AT - DualBeam  
FEI Company

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The Helios NanoLab 1200AT can create site-specific TEM samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter. An optional Automated...
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Helios NanoLab 460F1 - DualBeam  
FEI Company

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The Helios Nanolab 460F1 combines the industry leading, highest resolution Elstar+UC SEM with the most advanced Tomahawk FIB for best-in-class imaging and milling performance. 
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Helios NanoLab 460HP - DualBeam  
FEI Company

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The Helios NanoLab series is the world’s most advanced DualBeam platform for imaging, analysis, and TEM sample preparation in semiconductor failure analysis, process development and process...
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Helios NanoLab™ - DualBeam™   

4 out of 5


FEI Company

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The Helios NanoLab™ 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeam™ platform,...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 3 out of 5

4 review(s) of this product / read all

Helios NanoLab™ 660 - DualBeam  
FEI Company

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The Helios NanoLab™ 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeam™...
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