Electron Microscopy
Electron microscopy is a powerful technique which uses an accelerated beam of electrons for sample imaging. Types of electron microscopy include transmission electron microscopy (TEM) and scanning electron microscopy (SEM) which includes FESEM and STEM. Electron microscopes have specific magnification and resolution. The type of EM determines the sample preparation and detectors required. Learn about the latest products, user reviews, application articles, news, videos and webinars.
Product Reviews
Tuan Dang
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To be seen as an authority on SelectScience, find your products to review today., Global Tungsten & Powders Corp.
alan chan
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To be seen as an authority on SelectScience, find your products to review today., energy conversion devices
Grace Ann Bello
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To be seen as an authority on SelectScience, find your products to review today., PPG Industries Inc
Latest news
News
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FIB-SEM Technology with Laser Ablation for Fast Sample Preparation
08 Mar 2012
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New JEOL Large Angle Energy Dispersive Spectrometer (EDS) for Ultrafast Elemental Mapping of S/TEM Samples
14 Jul 2011
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Uniscan Instruments Introduce a New Cell for Topographic Measurements
30 Mar 2011
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University Uses NanoInk's DPN® 5000 System for the Fabrication of Nanostructured Photonic Metamaterials
10 Feb 2011
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New Non-Destructive UV Cleaning Process for Electron Microscope Samples
06 Dec 2010
Events
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Microscopy & Microanalysis 2012
The Microscopy Society of America29 Jul 2012 - 01 Aug 2012
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The 15th European Microscopy Congress
Royal Microscopical Society16 Sep 2012 - 21 Sep 2012
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