Electron Microscopy

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JIB-4501 MultiBeam SEM-FIB

JEOL USA



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JIB-4601F Multibeam System

JEOL USA



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Cross Section Polisher II

JEOL USA



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JIB-4000 High Throughput FIB

JEOL USA



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PELCO® STEM Imaging Holder

Ted Pella Inc.



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EBSD QuasOr

Thermo Fisher Scientific



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PP3010T Cryo-SEM Preparation System

Electron Microscopy Sciences



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SU8200 Series CFE SEM

Hitachi High Technologies America, Inc.



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QUANTAX WDS

Bruker-Nano



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QUANTAX Micro-XRF

Bruker-Nano



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Titan Krios™ - Transmission Electron Microscope

FEI Company



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Titan ETEM G2 - Transmission Electron Microscope

FEI Company



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Titan Themis - Transmission Electron Microscope

FEI Company



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Tecnai Femto UEM - Transmission Electron Microscope

FEI Company



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Tecnai G2 - Transmission Electron Microscope

FEI Company



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Tecnai Osiris - Transmission Electron Microscope

FEI Company



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Tecnai Arctica - Transmission Electron Microscope

FEI Company



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Tecnai iCorr - Transmission Electron Microscope

FEI Company



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Talos - Transmission Electron Microscope

FEI Company



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ExSolve Wafer TEM Prep

FEI Company



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Scios - DualBeam™

FEI Company



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CLM-3D - DualBeam

FEI Company



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Versa 3D - DualBeam™

FEI Company



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Certus 3D - Dualbeam

FEI Company



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Helios NanoLab™ 660 - DualBeam

FEI Company



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