Electron Microscopy

Read user reviews, compare products and contact manufacturers of Electron Microscopy products, including scanning, transmission and microprobe electron microscopy on SelectScience.

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Electron Microscopes (92)

Electron Microscopy Accessories (39)



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Tecnai iCorr - Transmission Electron Microscope  
FEI Company

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Tecnai with iCorr is unique in the way it solves the challenges related to CLEM. It's an integrated instrument in terms of hardware and software that seamlessly merges EM imaging with...
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Tecnai Osiris - Transmission Electron Microscope  
FEI Company

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he Tecnai Osiris™ is a fully digital 200 kV S/TEM system, designed to deliver revolutionary analytical performance in all imaging and analytical modes. Tecnai Osiris features the unique...
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Tecnai with iCorr - A Fully Integrated Correlative Sol...  
FEI Company

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FEI’s fast, accurate and automated solution for correlative light and electron microscopy, Tecnai with iCorr is the first integrated light and electron microscope. Combining a fluorescence...
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Teneo VS SEM  
FEI Company

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Highest quality isotropic 3D data from large sample volumes. Teneo VSTM SEM is a novel Serial Block Face Imaging solution that combines mechanical sectioning with virtual sectioning...
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Titan ETEM G2 - Transmission Electron Microscope  
FEI Company

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Environmental Transmission Electron Microscope for dynamic in situ exploration of functional nanomaterials and devices at the nanometer and atomic scale.
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Titan Halo  
FEI Company

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Based on the Titan Krios ultimate platform for biological imaging, Titan Halo combines versatility and flexibility with impressive, superior optical quality. The Titan Halo™...
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Titan Krios™ - Transmission Electron Microscope  
FEI Company

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The Titan Krios™ transmission electron microscope is tailored for use in protein and cellular imaging. Its revolutionary cryo-based technology and stability permits a full range of...
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Titan Themis - Transmission Electron Microscope  
FEI Company

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 Titan Themis TEM builds on the proven Cs corrected Titan platform to deliver the fastest time to data and the best S/TEM image quality for rapid access to crystal clear atomic scale...
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Titan™ - Transmission Electron Microscope  

4 out of 5


FEI Company

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Since its introduction in 2005, the Titan's superior product design and proven ability to deliver ground-breaking results have made it the preferred scanning/transmission electron...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 3 out of 5

8 review(s) of this product / read all

V400 ACE - Focused Ion Beam  
FEI Company

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The V400ACE is specifically designed to meet the challenges of advanced designs and processes: smaller geometries, higher circuit densities, exotic materials and complex interconnect...
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Verios (XHR) - Scanning Electron Microscope  
FEI Company

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The Verios is the second generation of FEI’s leading XHR (extreme high resolution) SEM family. It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for...
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Versa 3D - DualBeam™  
FEI Company

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Building on the history and success of FEI's pioneering DualBeam, low vacuum and ESEM™ expertise, FEI introduces the most versatile DualBeam instrument to date. The Versa 3D offers...
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Vion Plasmsa - Focused Ion Beam  
FEI Company

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The FEI Vion™ Plasma Focused Ion Beam System (PFIB) adds significantly more capacity to your lab, with best-in-class milling and imaging performance in a single, easy-to-use instrument. ...
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695 Precision Ion Polishing System (PIPS™ II)  

4 out of 5


Gatan Inc.

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The Precision Ion Polishing System II (PIPS™II) is a revolutionary enhancement of the PIPS™ Ion Mill System which has defined the standard for TEM sample preparation for 20 years. The...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

Analytical TableTop Microscope TM3000  

4 out of 5


Hitachi High Technologies America, Inc.

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It's simplicity enables all users, even those new to Electron Microscopy (EM), to image their samples and to obtain high quality, high resolution images within minutes. No special sample...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

H-9500, high performance TEM  
Hitachi High Technologies America, Inc.

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The H-9500 is a high performance TEM featuring a single crystal LaB6 electron source. This allows 0.102 nm crystal lattice resolution and 0.18 nm point to point to be achieved. The...
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HD-2700 Cs Corrected STEM  
Hitachi High Technologies America, Inc.

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The HD-2700 is the top-of-the-range STEM featuring optional spherical aberration correction developed in collaboration with CEOS GmbH ot offer significantly improved resolution and...
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HF-3300 300 kV FE TEM  
Hitachi High Technologies America, Inc.

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The HF-3300 300 kV FE TEM is a powerful analytical and high resolution TEM/STEM with inherent high beam brightness, high coherence, high energy resolution, and Hitachi unique functions! ...
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Hitachi VP-SEM SU1510  
Hitachi High Technologies America, Inc.

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Hitachi VP-SEM SU1510 - Top performance in very compact size The new Hitachi SU1510 VP-SEM combines the high-performance electron optics of the S-3400N and S-3700N with an ultra-compact...
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HT7700 120 kV Automated TEM  
Hitachi High Technologies America, Inc.

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Hitachi offers the sleek HT7700 for maximum performance and productivity. The radical design incorporates the ergonomics and user friendliness of a SEM with advanced automation,...
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IM4000 Ion Milling System  
Hitachi High Technologies America, Inc.

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The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new...
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NB5000 nanoDUE'T FIB-SEM  
Hitachi High Technologies America, Inc.

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The Hitachi NB5000 FIB-SEM integrates a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM. Like all our products, all components have been designed with...
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S-3400N Fully Automated VP SEM  

5 out of 5


Hitachi High Technologies America, Inc.

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The S-3400N is the World Class Variable Pressure SEM The S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment. The...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

S-3700N Ultra Large VP-SEM  
Hitachi High Technologies America, Inc.

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The S-3700N features an ultra large specimen chamber and stage to allow observation of specimens at diameters up to 300mm. Hitachi Variable Pressure SEM (VP-SEM) series have been received...
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SU3500 Premium VP-SEM  
Hitachi High Technologies America, Inc.

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The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive...
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