Electron Microscopy

Read user reviews, compare products and contact manufacturers of Electron Microscopy products, including scanning, transmission and microprobe electron microscopy on SelectScience.

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Tecnai G2 - Transmission Electron Microscope  

The Tecnai G2 transmission electron microscope unifies fast, efficient and easy operation with proven reliability to serve many applications needs – from basic, rapid sample screening to...
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Tecnai iCorr - Transmission Electron Microscope  

Tecnai with iCorr is unique in the way it solves the challenges related to CLEM. It's an integrated instrument in terms of hardware and software that seamlessly merges EM imaging with...
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Tecnai Osiris - Transmission Electron Microscope  

he Tecnai Osiris™ is a fully digital 200 kV S/TEM system, designed to deliver revolutionary analytical performance in all imaging and analytical modes. Tecnai Osiris features the unique...
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Tecnai with iCorr - A Fully Integrated Correlati...  

FEI’s fast, accurate and automated solution for correlative light and electron microscopy, Tecnai with iCorr is the first integrated light and electron microscope. Combining a fluorescence...
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Teneo VS SEM  

Highest quality isotropic 3D data from large sample volumes. Teneo VSTM SEM is a novel Serial Block Face Imaging solution that combines mechanical sectioning with virtual sectioning...
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Titan ETEM G2 - Transmission Electron Microscope  

Environmental Transmission Electron Microscope for dynamic in situ exploration of functional nanomaterials and devices at the nanometer and atomic scale.
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Titan Halo  

Based on the Titan Krios ultimate platform for biological imaging, Titan Halo combines versatility and flexibility with impressive, superior optical quality. The Titan Halo™...
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Titan Krios™ - Transmission Electron Microscope  

The Titan Krios™ transmission electron microscope is tailored for use in protein and cellular imaging. Its revolutionary cryo-based technology and stability permits a full range of...
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Titan Themis - Transmission Electron Microscope  

 Titan Themis TEM builds on the proven Cs corrected Titan platform to deliver the fastest time to data and the best S/TEM image quality for rapid access to crystal clear atomic scale...
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Titan™ - Transmission Electron Microscope  

4 out of 5



Since its introduction in 2005, the Titan's superior product design and proven ability to deliver ground-breaking results have made it the preferred scanning/transmission electron...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

8 review(s) of this product / Read All

V400 ACE - Focused Ion Beam  

The V400ACE is specifically designed to meet the challenges of advanced designs and processes: smaller geometries, higher circuit densities, exotic materials and complex interconnect...
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Verios (XHR) - Scanning Electron Microscope  

The Verios is the second generation of FEI’s leading XHR (extreme high resolution) SEM family. It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for...
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Versa 3D - DualBeam™  

Building on the history and success of FEI's pioneering DualBeam, low vacuum and ESEM™ expertise, FEI introduces the most versatile DualBeam instrument to date. The Versa 3D offers...
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Vion Plasmsa - Focused Ion Beam  

The FEI Vion™ Plasma Focused Ion Beam System (PFIB) adds significantly more capacity to your lab, with best-in-class milling and imaging performance in a single, easy-to-use instrument. ...
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695 Precision Ion Polishing System (PIPS™ II)  

4 out of 5



The Precision Ion Polishing System II (PIPS™II) is a revolutionary enhancement of the PIPS™ Ion Mill System which has defined the standard for TEM sample preparation for 20 years. The...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / Read All

Analytical TableTop Microscope TM3000  

4 out of 5



It's simplicity enables all users, even those new to Electron Microscopy (EM), to image their samples and to obtain high quality, high resolution images within minutes. No special sample...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 5 out of 5

2 review(s) of this product / Read All

H-9500, high performance TEM  

The H-9500 is a high performance TEM featuring a single crystal LaB6 electron source. This allows 0.102 nm crystal lattice resolution and 0.18 nm point to point to be achieved. The...
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HD-2700 Cs Corrected STEM  

The HD-2700 is the top-of-the-range STEM featuring optional spherical aberration correction developed in collaboration with CEOS GmbH ot offer significantly improved resolution and...
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HF-3300 300 kV FE TEM  

The HF-3300 300 kV FE TEM is a powerful analytical and high resolution TEM/STEM with inherent high beam brightness, high coherence, high energy resolution, and Hitachi unique functions! ...
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Hitachi VP-SEM SU1510  

Hitachi VP-SEM SU1510 - Top performance in very compact size The new Hitachi SU1510 VP-SEM combines the high-performance electron optics of the S-3400N and S-3700N with an ultra-compact...
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HT7700 120 kV Automated TEM  

Hitachi offers the sleek HT7700 for maximum performance and productivity. The radical design incorporates the ergonomics and user friendliness of a SEM with advanced automation,...
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IM4000 Ion Milling System  

The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new...
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NB5000 nanoDUE'T FIB-SEM  

The Hitachi NB5000 FIB-SEM integrates a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM. Like all our products, all components have been designed with...
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S-3400N Fully Automated VP SEM  

5 out of 5



The S-3400N is the World Class Variable Pressure SEM The S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment. The...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

2 review(s) of this product / Read All

S-3700N Ultra Large VP-SEM  

The S-3700N features an ultra large specimen chamber and stage to allow observation of specimens at diameters up to 300mm. Hitachi Variable Pressure SEM (VP-SEM) series have been received...
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SU3500 Premium VP-SEM  

The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive...
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SU6600 Analytical VP FE-SEM  

4 out of 5



The SU6600 is Hitachi's latest high resolution analytical field emission SEM with Variable Pressure technology allowing observation and analysis of any type of wet, oily or dirty sample.
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  • Ease of use 4 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / Read All

SU-70 UHR Schottky (Analytical) FE-SEM  

SU8000 Series UHR Cold-Emission FE-SEM  

The SU8000 Series is Hitachi's latest product family of ultra-high performance, semi-in-lens SEM with cold-field emission. The series was developed in response to the growing demand...
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SU8200 Series CFE SEM  

Ultra-high Resolution Scanning Electron Microscope SU8200 Series - Innovative Cold Field Emission Gun with Unmatched Resolution and Beam Stability This novel CFE gun employs a Hitachi...
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SU9000 UHR FE-SEM  

The SU9000 Ultra High Resolution FE-SEM is Hitachi's new premium UHR FE-SEM. It features unique electron optics, with the sample positioned inside a gap of the split objective lens pole...
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ZONE Desktop Sample Cleaner and Desiccator for S...  

Sample surfaces are inevitably coated with hydrocarbon contamination due to sample preparation or from storage. The ZONE desktop sample cleaner/desiccator gently removes contaminations to...
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Ultra-high Resolution Scanning Electron Microsco...  

5 out of 5



Extending the capabilities of the successful S-900 and S-5000 family of in-lense SEMs, the Hitachi S-5500 cold field emission scanning electron microscope sets a new standard for ultra-high...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / Read All

Cross Section Polisher II  

Ion beam cross section polisher with real time process monitoring. • CCD zoom camera (20 to 100x) for real time monitoring of the milling process • CCD camera incorporated in the stage...
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JEM-1400 Transmission Electron Microscope  

5 out of 5



The JEM-1400 is a high performance, high contrast, 120kV TEM with excellent imaging and analytical capabilities in one compact, easy-to-use instrument. With an acceleration voltage of 40 to...
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  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 5 out of 5

2 review(s) of this product / Read All

JEM-2100F Transmission Electron Microscope  

4 out of 5



The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

9 review(s) of this product / Read All

JEM-2200FS Transmission Electron Microscope  

4 out of 5



The new JEM-2200FS combines a 200kV field emission gun (FEG) and in in-column energy filter (Omega Filter) to produce a high-end, optimally configured TEM for energy filtered imagery. ...
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  • Ease of use 4 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

4 review(s) of this product / Read All

JEM-ARM200F STEM  

5 out of 5



The JEM-ARM200F, incorporating a spherical aberration corrector for electron optic system as standard, has achieved a scanning transmission image (STEM-HAADF) resolution of 0.08 nm, the...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / Read All

JIB-4000 High Throughput FIB  

The JIB-4000 is a focused ion beam sample milling system used for preparation of STEM/TEM samples and fabrication of cross section samples for SEM imaging. It is especially effective for...
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JIB-4501 MultiBeam SEM-FIB  

The JIB-4501 is a multi beam SEM-FIB system capable of surface/internal 3D imaging and analysis in a single unit. Featuring an optimum design, the system supports a complete operation from...
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JIB-4601F Multibeam System  

All in one tool - Various applications are offered with one instrument: • Optimum-geometry specimen chamber for all functions of FIB milling, SEM imaging, and EDS/EBSD analyses •...
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JSM-6490LV Scanning Electron Microscope  

4 out of 5



The JSM-6490LV is a high-performance, scanning electron microscope with a high resolution of 3.0nm. The low vacuum mode (which can be accessed by the click of a mouse), allows for...
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  • Ease of use 4 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

3 review(s) of this product / Read All

JSM-6510LV Scanning Electron Microscope  

JSM-6510LV Scanning Electron Microscope - World’s most widely-used family of SEMs!   The JEOL JSM-6510LV low vacuum SEM is a high-performance, low cost, scanning electron...
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JSM-6610LV Scanning Electron Microscope  

JSM-6610LV Scanning Electron Microscope - World’s most widely-used family of SEMs! The JEOL JSM-6610LV low vacuum SEM is a high-performance scanning electron microscope for fast...
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JSM-7100F Scanning Electron Microscope  

5 out of 5



The JSM-7100F, Thermal Field Emission SEM, is the ideal platform for demanding analytical applications as well as those requiring high resolution and ease-of-use. The JSM-7001F has a large,...
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  • Ease of use 4 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / Read All

JSM-7500F Scanning Electron Microscope  

4 out of 5



The JSM-7500F is an analytical Field Emission SEM featuring enhanced performance, ease of operation, and energy efficiency. The JSM-7500F offers the highest resolution at the lowest kV...
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  • Ease of use 3 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / Read All

NeoScope Benchtop SEM  

The NeoScope benchtop SEM economically complements both optical microscopes and traditional SEMs. The NeoScope makes it easy to obtain high magnification images with high resolution...
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3D EDS Analysis  

Overview • Automated, FIB milling is followed by EDS X-ray map acquisition for each slice • Fast, data collection uses unique large area X-MaxN SDD • Complete, collection of the...
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AZtecEnergy - EDS Software  

AZtecEnergy will change the way you collect, process and view EDS data. Whether novice or expect, you’ll gather more accurate results, see everything in stunning high resolution, and finish...
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X-act - 10mm2 SDD Detector  

x-act incorporates 40 years of Oxford Instruments’ expertise,and is backed up by worldwide sales, service and customer support specialists. Overview • Detects elements from Be to Pu ...
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X-Max SDD Detector  

4 out of 5



X-MaxN comes in a range of detector sizes, from 20 mm2 for microanalysis up to an astounding 150 mm2 for advanced nanoanalysis. The latter is the largest SDD in the market and delivers more...
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  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / Read All

108 Auto Sputter Coater  

108 Auto Sputter Coater - ideal for routine sample preparation for scanning electron microscopy The Ted Pella 108 Auto Sputter Coater is ideally suited for automated high quality...
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PELCO easiGlow™ Glow Discharge Cleaning System  

5 out of 5



For one of the most common glow discharge applications, making TEM support films or grids hydrophilic using air, the PELCO easiGlow™ uses an automated and quick cycle with fully selectable...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / Read All

PELCO® STEM Imaging Holder  

The PELCO® STEM imaging holder enables STEM imaging in the SEM by using the standard Everhart-Thornley SE detector in the SEM chamber. The standard 3mm TEM grid is placed in the grid holder...
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VEGA3 SB SEM  

5 out of 5



A fully PC controlled SEM with conventional tungsten heated cathode intended both for high vacuum as well as for low vacuum operations. Outstanding optical properties, flicker-free...
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  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / Read All

EBSD QuasOr  

Thermo Scientific QuasOr, the no compromise EBSD. Electron Backscatter Diffraction (EBSD) enables nanostructural analysis in the electron microscope by characterizing the crystalline...
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RISE Microscopy - Correlative Raman Imaging and ...  

RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging and links ultra-structural surface properties to molecular compound information. ...
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