Electron Microscopy

Read user reviews, compare products and contact manufacturers of Electron Microscopy products, including scanning, transmission and microprobe electron microscopy on SelectScience.

SUB CATEGORIES



Electron Microscopes (91)

Electron Microscopy Accessories (38)



            SORT BY  2 of 2   Page     1 2 
PP3010T Cryo-SEM Preparation System  
Electron Microscopy Sciences

Request info

The PP3010T is a highly automated, easy to use, column-mounted, gas-cooled cryo preparation system suitable for most makes and models of SEM, FE-SEM and FIB/SEM. The PP3010T has all the...
Read more
QUANTIFOIL® – Holey Carbon Films  

4 out of 5


Electron Microscopy Sciences

Request info

QUANTIFOIL® is a perforated support foil with pre-defined hole size, shape and arrangement. It has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS)...
Read more
  • Ease of use 5 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Analytical TableTop Microscope TM3000  

4 out of 5


Hitachi High Technologies America, Inc.

Request info

It's simplicity enables all users, even those new to Electron Microscopy (EM), to image their samples and to obtain high quality, high resolution images within minutes. No special sample...
Read more
  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

H-9500, high performance TEM  
Hitachi High Technologies America, Inc.

Request info

The H-9500 is a high performance TEM featuring a single crystal LaB6 electron source. This allows 0.102 nm crystal lattice resolution and 0.18 nm point to point to be achieved. The...
Read more
HD-2700 Cs Corrected STEM  
Hitachi High Technologies America, Inc.

Request info

The HD-2700 is the top-of-the-range STEM featuring optional spherical aberration correction developed in collaboration with CEOS GmbH ot offer significantly improved resolution and...
Read more
HF-3300 300 kV FE TEM  
Hitachi High Technologies America, Inc.

Request info

The HF-3300 300 kV FE TEM is a powerful analytical and high resolution TEM/STEM with inherent high beam brightness, high coherence, high energy resolution, and Hitachi unique functions! ...
Read more
Hitachi VP-SEM SU1510  
Hitachi High Technologies America, Inc.

Request info

Hitachi VP-SEM SU1510 - Top performance in very compact size The new Hitachi SU1510 VP-SEM combines the high-performance electron optics of the S-3400N and S-3700N with an ultra-compact...
Read more
HT7700 120 kV Automated TEM  
Hitachi High Technologies America, Inc.

Request info

Hitachi offers the sleek HT7700 for maximum performance and productivity. The radical design incorporates the ergonomics and user friendliness of a SEM with advanced automation,...
Read more
IM4000 Ion Milling System  
Hitachi High Technologies America, Inc.

Request info

The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new...
Read more
NB5000 nanoDUE'T FIB-SEM  
Hitachi High Technologies America, Inc.

Request info

The Hitachi NB5000 FIB-SEM integrates a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM. Like all our products, all components have been designed with...
Read more
S-3400N Fully Automated VP SEM  

5 out of 5


Hitachi High Technologies America, Inc.

Request info

The S-3400N is the World Class Variable Pressure SEM The S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment. The...
Read more
  • Ease of use 5 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

S-3700N Ultra Large VP-SEM  
Hitachi High Technologies America, Inc.

Request info

The S-3700N features an ultra large specimen chamber and stage to allow observation of specimens at diameters up to 300mm. Hitachi Variable Pressure SEM (VP-SEM) series have been received...
Read more
SU3500 Premium VP-SEM  
Hitachi High Technologies America, Inc.

Request info

The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive...
Read more
SU6600 Analytical VP FE-SEM  

4 out of 5


Hitachi High Technologies America, Inc.

Request info

The SU6600 is Hitachi's latest high resolution analytical field emission SEM with Variable Pressure technology allowing observation and analysis of any type of wet, oily or dirty sample.
Read more
  • Ease of use 4 out of 5
  • After sales service 3 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

SU-70 UHR Schottky (Analytical) FE-SEM  
Hitachi High Technologies America, Inc.

Request info


Read more
SU8000 Series UHR Cold-Emission FE-SEM  
Hitachi High Technologies America, Inc.

Request info

The SU8000 Series is Hitachi's latest product family of ultra-high performance, semi-in-lens SEM with cold-field emission. The series was developed in response to the growing demand...
Read more
SU8200 Series CFE SEM  
Hitachi High Technologies America, Inc.

Request info

Ultra-high Resolution Scanning Electron Microscope SU8200 Series - Innovative Cold Field Emission Gun with Unmatched Resolution and Beam Stability This novel CFE gun employs a Hitachi...
Read more
SU9000 UHR FE-SEM  
Hitachi High Technologies America, Inc.

Request info

The SU9000 Ultra High Resolution FE-SEM is Hitachi's new premium UHR FE-SEM. It features unique electron optics, with the sample positioned inside a gap of the split objective lens pole...
Read more
ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM  
Hitachi High Technologies America, Inc.

Request info

Sample surfaces are inevitably coated with hydrocarbon contamination due to sample preparation or from storage. The ZONE desktop sample cleaner/desiccator gently removes contaminations to...
Read more
Ultra-high Resolution Scanning Electron Microscope S-5...  

5 out of 5


Hitachi High-Technologies Corp (Microscopy)

Request info

Extending the capabilities of the successful S-900 and S-5000 family of in-lense SEMs, the Hitachi S-5500 cold field emission scanning electron microscope sets a new standard for ultra-high...
Read more
  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

Cross Section Polisher II  
JEOL USA

Request info

Ion beam cross section polisher with real time process monitoring. • CCD zoom camera (20 to 100x) for real time monitoring of the milling process • CCD camera incorporated in the stage...
Read more
JEM-1400 Transmission Electron Microscope  

4 out of 5


JEOL USA

Request info

The JEM-1400 is a high performance, high contrast, 120kV TEM with excellent imaging and analytical capabilities in one compact, easy-to-use instrument. With an acceleration voltage of 40 to...
Read more
  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 5 out of 5

2 review(s) of this product / read all

JEM-2100F Transmission Electron Microscope  

4 out of 5


JEOL USA

Request info

The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic...
Read more
  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

9 review(s) of this product / read all

JEM-2200FS Transmission Electron Microscope  

4 out of 5


JEOL USA

Request info

The new JEM-2200FS combines a 200kV field emission gun (FEG) and in in-column energy filter (Omega Filter) to produce a high-end, optimally configured TEM for energy filtered imagery. ...
Read more
  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

4 review(s) of this product / read all

JEM-ARM200F STEM  

5 out of 5


JEOL USA

Request info

The JEM-ARM200F, incorporating a spherical aberration corrector for electron optic system as standard, has achieved a scanning transmission image (STEM-HAADF) resolution of 0.08 nm, the...
Read more
  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

JIB-4000 High Throughput FIB  
JEOL USA

Request info

The JIB-4000 is a focused ion beam sample milling system used for preparation of STEM/TEM samples and fabrication of cross section samples for SEM imaging. It is especially effective for...
Read more
JIB-4501 MultiBeam SEM-FIB  
JEOL USA

Request info

The JIB-4501 is a multi beam SEM-FIB system capable of surface/internal 3D imaging and analysis in a single unit. Featuring an optimum design, the system supports a complete operation from...
Read more
JIB-4601F Multibeam System  
JEOL USA

Request info

All in one tool - Various applications are offered with one instrument: • Optimum-geometry specimen chamber for all functions of FIB milling, SEM imaging, and EDS/EBSD analyses •...
Read more
JSM-6490LV Scanning Electron Microscope  

4 out of 5


JEOL USA

Request info

The JSM-6490LV is a high-performance, scanning electron microscope with a high resolution of 3.0nm. The low vacuum mode (which can be accessed by the click of a mouse), allows for...
Read more
  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

3 review(s) of this product / read all

JSM-6510LV Scanning Electron Microscope  
JEOL USA

Request info

JSM-6510LV Scanning Electron Microscope - World’s most widely-used family of SEMs!   The JEOL JSM-6510LV low vacuum SEM is a high-performance, low cost, scanning electron...
Read more
JSM-6610LV Scanning Electron Microscope  
JEOL USA

Request info

JSM-6610LV Scanning Electron Microscope - World’s most widely-used family of SEMs! The JEOL JSM-6610LV low vacuum SEM is a high-performance scanning electron microscope for fast...
Read more
JSM-7100F Scanning Electron Microscope  

5 out of 5


JEOL USA

Request info

The JSM-7100F, Thermal Field Emission SEM, is the ideal platform for demanding analytical applications as well as those requiring high resolution and ease-of-use. The JSM-7001F has a large,...
Read more
  • Ease of use 4 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

JSM-7500F Scanning Electron Microscope  

4 out of 5


JEOL USA

Request info

The JSM-7500F is an analytical Field Emission SEM featuring enhanced performance, ease of operation, and energy efficiency. The JSM-7500F offers the highest resolution at the lowest kV...
Read more
  • Ease of use 3 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

EM CPD300  

5 out of 5


Leica Microsystems

Request info

The drying of biological specimens such as pollen, tissue, plants, insects, as well as industrial samples, for example MEMS (Micro Electro Mechanical Systems) for SEM analysis can be...
Read more
  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

1 review(s) of this product / read all

Ion Beam Slope Cutter Leica EM TIC 3X  
Leica Microsystems

Request info

chieving high quality cross-sections of almost any material, revealing the internal structures of the sample with scarcely any deformation or damage was never before more convenient than...
Read more
Leica EM AMW - Tissue Processor for Electron Microscopy  
Leica Microsystems

Request info

With minimal user interface, rapidly process, embed, and polymerize specimens into resin with the Leica EM AMW’s unique, highly automated system. The patented combination of microwave...
Read more
Leica EM FC7 - Cryochamber  
Leica Microsystems

Request info

Change your Ultramicrotome Leica EM UC6 or Leica EM UC7 to a Cryoultramicrotome within minutes by mounting the Cryochamber Leica EM FC7 and prepare your cryo-sections ( -15° to -185°C) for...
Read more
Leica EM GP  

5 out of 5


Leica Microsystems

Request info

For the preparation of vitrified fluid samples or extremely thin samples for cryo-TEM, including biological suspensions and industrial emulsions in both, aqueous and inorganic solvents. ...
Read more
  • Ease of use 4 out of 5
  • After sales service 5 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

Leica EM KMR3 - Glass Knifemaker  
Leica Microsystems

Request info

Perfect Glass Knives for perfect ultrathin sections for EM and LM applications The balanced break method of the Leica EM KMR3 ensures perfect glass knives in three thicknesses 6,4 mm, 8...
Read more
Leica EM MED020 - Modular High Vacuum Coating System  
Leica Microsystems

Request info

The Leica EM MED020 is a precision high vacuum coating system for sputtering, carbon thread, carbon rod, top down and bottom up thermal resistance and dual electron beam evaporation. ...
Read more
Leica EM SPF - Self Pressurised Freezer  
Leica Microsystems

Request info

Are you looking for an alternative cryo-fixation method to freeze your biological specimens such as cells, free-living bacteria, yeast cells, unicellular organisms etc. in their native...
Read more
Leica EM TP - Automated Routine Tissue Processor  
Leica Microsystems

Request info

The innovative Leica EM TP is the first tissue processor designed for EM and LM resin processing, that features a heating/cooling system with pre-heat and pre-cool capabilities to maintain...
Read more
Leica EM UC7 - Ultramicrotome  

4 out of 5


Leica Microsystems

Request info

The Ultramicrotome Leica EM UC7 provides easy preparation of semi- and ultrathin sections as well as perfect, smooth surfaces of biological and industrial samples for TEM, SEM, AFM and LM...
Read more
  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

3 review(s) of this product / read all

NeoScope Benchtop SEM  
Nikon Instruments Europe

Request info

The NeoScope benchtop SEM economically complements both optical microscopes and traditional SEMs. The NeoScope makes it easy to obtain high magnification images with high resolution...
Read more
3D EDS Analysis  
Oxford Instruments Inc.

Request info

Overview • Automated, FIB milling is followed by EDS X-ray map acquisition for each slice • Fast, data collection uses unique large area X-MaxN SDD • Complete, collection of the...
Read more
AZtecEnergy - EDS Software  
Oxford Instruments Inc.

Request info

AZtecEnergy will change the way you collect, process and view EDS data. Whether novice or expect, you’ll gather more accurate results, see everything in stunning high resolution, and finish...
Read more
X-act - 10mm2 SDD Detector  
Oxford Instruments Inc.

Request info

x-act incorporates 40 years of Oxford Instruments’ expertise,and is backed up by worldwide sales, service and customer support specialists. Overview • Detects elements from Be to Pu ...
Read more
X-Max SDD Detector  

4 out of 5


Oxford Instruments Inc.

Request info

X-MaxN comes in a range of detector sizes, from 20 mm2 for microanalysis up to an astounding 150 mm2 for advanced nanoanalysis. The latter is the largest SDD in the market and delivers more...
Read more
  • Ease of use 4 out of 5
  • After sales service 4 out of 5
  • Value for money 4 out of 5

2 review(s) of this product / read all

108 Auto Sputter Coater  
Ted Pella Inc.

Request info

108 Auto Sputter Coater - ideal for routine sample preparation for scanning electron microscopy The Ted Pella 108 Auto Sputter Coater is ideally suited for automated high quality...
Read more
PELCO easiGlow™ Glow Discharge Cleaning System  

5 out of 5


Ted Pella Inc.

Request info

For one of the most common glow discharge applications, making TEM support films or grids hydrophilic using air, the PELCO easiGlow™ uses an automated and quick cycle with fully selectable...
Read more
  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

PELCO® STEM Imaging Holder  
Ted Pella Inc.

Request info

The PELCO® STEM imaging holder enables STEM imaging in the SEM by using the standard Everhart-Thornley SE detector in the SEM chamber. The standard 3mm TEM grid is placed in the grid holder...
Read more
VEGA3 SB SEM  

5 out of 5


Tescan

Request info

A fully PC controlled SEM with conventional tungsten heated cathode intended both for high vacuum as well as for low vacuum operations. Outstanding optical properties, flicker-free...
Read more
  • Ease of use 5 out of 5
  • After sales service 5 out of 5
  • Value for money 5 out of 5

1 review(s) of this product / read all

EBSD QuasOr  
Thermo Fisher Scientific

Request info

Thermo Scientific QuasOr, the no compromise EBSD. Electron Backscatter Diffraction (EBSD) enables nanostructural analysis in the electron microscope by characterizing the crystalline...
Read more
RISE Microscopy - Correlative Raman Imaging and Scanni...  
WITec GmbH

Request info

RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging and links ultra-structural surface properties to molecular compound information. ...
Read more

 SHOW   25 | 50 | 75 | 100 items/page

2 of 2   Page     1 2 


 
Looking For General Lab Products?

Click here to go to the General Lab product directory