Electron Microscopy (Forensics) Electron Microscopy Products, Reviews and Suppliers on SelectScience

Electron Microscopy

Read user reviews, compare products and contact manufacturers of Electron Microscopy products, including scanning, transmission and microprobe electron microscopy on SelectScience.

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Electron Microscopes (54)

Electron Microscopy Accessories (42)

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IM4000 Ion Milling System
Hitachi High Technologies America, Inc.

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The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new...
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NB5000 nanoDUE'T FIB-SEM
Hitachi High Technologies America, Inc.

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The Hitachi NB5000 FIB-SEM integrates a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM. Like all our products, all components have been designed with...
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S-3400N Fully Automated VP SEM

5 out of 5

Hitachi High Technologies America, Inc.

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The S-3400N is the World Class Variable Pressure SEM The S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment. The...
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Ease of use 5 out of 5
After sales service 4 out of 5
Value for money 4 out of 5

2 review(s) of this product / read all

S-3700N Ultra Large VP-SEM
Hitachi High Technologies America, Inc.

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The S-3700N features an ultra large specimen chamber and stage to allow observation of specimens at diameters up to 300mm. Hitachi Variable Pressure SEM (VP-SEM) series have been received...
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SU3500 Premium VP-SEM
Hitachi High Technologies America, Inc.

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The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive...
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SU6600 Analytical VP FE-SEM

4 out of 5

Hitachi High Technologies America, Inc.

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The SU6600 is Hitachi's latest high resolution analytical field emission SEM with Variable Pressure technology allowing observation and analysis of any type of wet, oily or dirty sample.
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Ease of use 4 out of 5
After sales service 3 out of 5
Value for money 4 out of 5

1 review(s) of this product / read all

SU-70 UHR Schottky (Analytical) FE-SEM
Hitachi High Technologies America, Inc.

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The SU8000 Series is Hitachi's latest product family of ultra-high performance, semi-in-lens SEM with cold-field emission. The series was developed in response to the growing demand...
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SU9000 UHR FE-SEM
Hitachi High Technologies America, Inc.

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The SU9000 Ultra High Resolution FE-SEM is Hitachi's new premium UHR FE-SEM. It features unique electron optics, with the sample positioned inside a gap of the split objective lens pole...
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ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM
Hitachi High Technologies America, Inc.

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Sample surfaces are inevitably coated with hydrocarbon contamination due to sample preparation or from storage. The ZONE desktop sample cleaner/desiccator gently removes contaminations to...
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Ultra-high Resolution Scanning Electron Microscope S-5...

5 out of 5

Hitachi High-Technologies Corp (Microscopy)

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Extending the capabilities of the successful S-900 and S-5000 family of in-lense SEMs, the Hitachi S-5500 cold field emission scanning electron microscope sets a new standard for ultra-high...
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Ease of use 5 out of 5
After sales service 5 out of 5
Value for money 5 out of 5

1 review(s) of this product / read all

Cross Section Polisher II
JEOL USA

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Ion beam cross section polisher with real time process monitoring. • CCD zoom camera (20 to 100x) for real time monitoring of the milling process • CCD camera incorporated in the stage...
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JEM-1400 Transmission Electron Microscope

4 out of 5

JEOL USA

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The JEM-1400 is a high performance, high contrast, 120kV TEM with excellent imaging and analytical capabilities in one compact, easy-to-use instrument. With an acceleration voltage of 40 to...
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Ease of use 4 out of 5
After sales service 4 out of 5
Value for money 5 out of 5

2 review(s) of this product / read all

JEM-2100F Transmission Electron Microscope

4 out of 5

JEOL USA

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The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic...
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Ease of use 4 out of 5
After sales service 4 out of 5
Value for money 4 out of 5

9 review(s) of this product / read all

JEM-2200FS Transmission Electron Microscope

4 out of 5

JEOL USA

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The new JEM-2200FS combines a 200kV field emission gun (FEG) and in in-column energy filter (Omega Filter) to produce a high-end, optimally configured TEM for energy filtered imagery. ...
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Ease of use 4 out of 5
After sales service 4 out of 5
Value for money 4 out of 5

4 review(s) of this product / read all

JEM-ARM200F STEM

5 out of 5

JEOL USA

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The JEM-ARM200F, incorporating a spherical aberration corrector for electron optic system as standard, has achieved a scanning transmission image (STEM-HAADF) resolution of 0.08 nm, the...
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Ease of use 5 out of 5
After sales service 5 out of 5
Value for money 5 out of 5

1 review(s) of this product / read all

JIB-4000 High Throughput FIB
JEOL USA

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The JIB-4000 is a focused ion beam sample milling system used for preparation of STEM/TEM samples and fabrication of cross section samples for SEM imaging. It is especially effective for...
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JIB-4501 MultiBeam SEM-FIB
JEOL USA

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The JIB-4501 is a multi beam SEM-FIB system capable of surface/internal 3D imaging and analysis in a single unit. Featuring an optimum design, the system supports a complete operation from...
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JIB-4601F Multibeam System
JEOL USA

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All in one tool　- Various applications are offered with one instrument: • Optimum-geometry specimen chamber for all functions of FIB milling, SEM imaging, and EDS/EBSD analyses •...
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JSM-6490LV Scanning Electron Microscope

4 out of 5

JEOL USA

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The JSM-6490LV is a high-performance, scanning electron microscope with a high resolution of 3.0nm. The low vacuum mode (which can be accessed by the click of a mouse), allows for...
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Ease of use 4 out of 5
After sales service 4 out of 5
Value for money 4 out of 5

3 review(s) of this product / read all

JSM-6510LV Scanning Electron Microscope
JEOL USA

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JSM-6510LV Scanning Electron Microscope - World’s most widely-used family of SEMs! The JEOL JSM-6510LV low vacuum SEM is a high-performance, low cost, scanning electron...
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JSM-6610LV Scanning Electron Microscope
JEOL USA

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JSM-6610LV Scanning Electron Microscope - World’s most widely-used family of SEMs! The JEOL JSM-6610LV low vacuum SEM is a high-performance scanning electron microscope for fast...
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JSM-7100F Scanning Electron Microscope

5 out of 5

JEOL USA

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The JSM-7100F, Thermal Field Emission SEM, is the ideal platform for demanding analytical applications as well as those requiring high resolution and ease-of-use. The JSM-7001F has a large,...
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Ease of use 4 out of 5
After sales service 5 out of 5
Value for money 5 out of 5

1 review(s) of this product / read all

JSM-7500F Scanning Electron Microscope

4 out of 5

JEOL USA

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The JSM-7500F is an analytical Field Emission SEM featuring enhanced performance, ease of operation, and energy efficiency. The JSM-7500F offers the highest resolution at the lowest kV...
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Ease of use 3 out of 5
After sales service 5 out of 5
Value for money 4 out of 5

1 review(s) of this product / read all

EM CPD300

5 out of 5

Leica Microsystems

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The drying of biological specimens such as pollen, tissue, plants, insects, as well as industrial samples, for example MEMS (Micro Electro Mechanical Systems) for SEM analysis can be...
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Ease of use 5 out of 5
After sales service 5 out of 5
Value for money 4 out of 5

1 review(s) of this product / read all

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