Electron Microscopy
Electron microscopy is a powerful technique which uses an accelerated beam of electrons for sample imaging. Types of electron microscopy include transmission electron microscopy (TEM) and scanning electron microscopy (SEM) which includes FESEM and STEM. Electron microscopes have specific magnification and resolution. The type of EM determines the sample preparation and detectors required. Learn about the latest products, user reviews, applications, news, videos and webinars.
Product Reviews
- Ease of use
- After sales service
- Value for money
"This is a beautiful instrument which is easy to use and perform accurate determination of samples."
Pablo Cancio
Membership StatusSelectScience Members can achieve membership status by writing product reviews. This helps other members to better understand the Reviewer’s experience and expertise.
| Status: | No. Reviews Published: |
| Member | 0 |
Reviewer | 1-4 |
| Advanced Reviewer | 5-14 |
| Expert Reviewer | 15+ |
| Review Panel Member | By Invitation |
Reviewers are also encouraged to publish a ‘public profile’ so others can benefit from a further understanding of the Reviewer’s applications and expertise.
Write a review today >>, Istituto Nazionale di Ottica (INO-CNR)
- Ease of use
- After sales service
- Value for money
"FEI has really good customer support and a friendly, knowledgeable support team. We recently acquired an Inspect F50 and I also have attended a demon..."
Jonathan Damseel
Membership StatusSelectScience Members can achieve membership status by writing product reviews. This helps other members to better understand the Reviewer’s experience and expertise.
| Status: | No. Reviews Published: |
| Member | 0 |
| Reviewer | 1-4 |
| Advanced Reviewer | 5-14 |
| Expert Reviewer | 15+ |
| Review Panel Member | By Invitation |
Reviewers are also encouraged to publish a ‘public profile’ so others can benefit from a further understanding of the Reviewer’s applications and expertise.
Write a review today >>, Cleveland State University
- Ease of use
- After sales service
- Value for money
"Easy to use, with excellent customer support. I have been using the instrument for about a year, it only took me a day to get my hands on the instrum..."
Ajay Zalavadia
Membership StatusSelectScience Members can achieve membership status by writing product reviews. This helps other members to better understand the Reviewer’s experience and expertise.
| Status: | No. Reviews Published: |
| Member | 0 |
| Reviewer | 1-4 |
| Advanced Reviewer | 5-14 |
| Expert Reviewer | 15+ |
| Review Panel Member | By Invitation |
Reviewers are also encouraged to publish a ‘public profile’ so others can benefit from a further understanding of the Reviewer’s applications and expertise.
Write a review today >>, Advanced Chemical Imaging Facility
Latest news
News
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PI Launches New Motion-Amplified Piezo Actuator: P-604 PiezoMove®
26 Apr 2013
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All-New Benchtop SEM Features EDS Analysis and 60,000X Imaging
24 Mar 2013
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Carl Zeiss to Exhibit Correlative Light and Electron Microscopy Solution at Pittcon 2013
13 Mar 2013
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JEOL to Present Latest Analysis and Imaging Capabilities at Pittcon 2013
13 Mar 2013
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XEI Scientific have been Award Patent for the Plasma Cleaning TEM Wand
19 Feb 2013
Application articles
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Low Voltage Scanning Electron Microscopy: Promises and Challenges
Agilent Technologies05 Nov 2012
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Size Determination & Visualization of Wear Debris from Orthopedic Implants
NanoSight Ltd30 May 2012
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New sCMOS vs. Current Microscopy Cameras
Andor Technology17 Feb 2012
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Maximizing Frame Rate Performance in EMCCDs
Andor Technology16 Feb 2012
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OptAcquire – Flexibility Need Not be Complicated
Andor Technology16 Feb 2012
Events
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Microscopy & Microanalysis 2013
The Microscopy Society of America04 Aug 2013 - 08 Aug 2013
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Analitica Latin America
Nürnberg Messe Brasil24 Sep 2013 - 26 Sep 2013
