JEOL USA Products

Scanning Electron Microscope Read more...

Field Emission Scanning Electron Microscope Read more...

High speed and high sensitive analysis was achieved by JEOL’s proprietary technologies. JMS-TQ4000GC was developed with all technologies and experience that were brewed in the development of high-end GC-MS of JEOL. Read more...

This 4th generation Neoscope incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes.  It is equipped with a large cha... Read more...

The JMS-TQ4000GC Triple-Quadrupole Mass Spectrometer accurately measures trace or residual pesticides in agricultural materials, trace levels of regulated chemicals in tap water, and simplifies quantitative analysis of persistent environm... Read more...

The AccuTOF™-DART® 4G is an atmospheric pressure ionization, high-resolution time-of-flight mass spectrometer (API-HRTOFMS). This robust and versatile mass spectrometer provides solutions for a wide variety of fields with interc... Read more...

In combination with comprehensive 2D gas chromatography (GCxGC) using the Zoex thermal modulator, the AccuTOF™ GCxGC Mass Spectrometer offers both powerful chromatographic separation and high-resolution mass spectra. Read more...

High-vacuum specimen preparation device that makes it easy to prepare samples for imaging and analysis with electron microscopes. Read more...

Sputter Coater Read more...

Carbon Coater Read more...

The JMS-T100LP AccuTOF™ LC-Express 4G Time-of-Flight Mass Spectrometer is based on our award-winning AccuTOF time-of-flight analyzer platform. The AccuTOF analyzer design employs elegant ion optics and an ADC-based digitizer to deli... Read more...

Thin Film Specimen Preparation Read more...

Multipurpose Analytical S/TEM Read more...

Atomic Resolution S/TEM Read more...

200kV Monochromated S/TEM Read more...

Field Emission EPMA Read more...

LaB6 EPMA Read more...

Focused Ion Beam Milling & Imaging System Read more...

Direct Write E-beam Lithography System Read more...

Direct Write E-beam Lithography System Read more...

E-Beam Mask/Reticle Writer Read more...

Atomic Resolution TEM Read more...

Field Emission Cryo-electron Microscope Read more...

The new JMS-Q1600GC UltraQuad™ SQ-Zeta Single Quad Mass Spectrometer of JEOL is our 6th generation high-end Gas Chromatograph Quadrupole Mass Spectrometer (GC-QMS) based on JEOL's 50 years of MS technologies and experience. Read more...

High-throughput Analytical S/TEM Read more...