Sensitized Emission FRET Measurements Using White-light TIRF Microscopy>

Application Articles

Sensitized Emission FRET Measurements Using White-light TIRF Microscopy
2 Sep 2011

This application note describes the acquisition of TIRF images using a broadband X-Cite® mercury light source without the cost of a laser and less photobleaching. This technique opens up advanced imaging to more researchers who want an affordable alternative that minimizes photobleaching associated with other technologies.