Application Note: Analysis of Materials in the Far-IR Spectral Region by ATR-FTIR
17 February 2012

The far infrared region can be of great interest for material analysis. This note shows that by using ATR samples can be simply placed into contact with the ATR crystal, pressure applied in the case of solid materials, and its spectrum measured. In the far-IR spectral region, ATR is shown to provide an additional benefit – the increase in band absorbance due to the wavelength dependence upon depth of penetration.

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