SelectScience – Product Review: X-Max Silicon Drift Detector, Oxford Instruments

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Product Review: X-Max Silicon Drift Detector, Oxford Instruments
2 October 2012

Dr. Sarah Haigh, a Lecturer at the University of Manchester who specializes in the characterization of materials, has recently started using the X-Max 80mm from Oxford Instruments. In this video Dr. Haigh tells SelectScience about some of the features and benefits of this large area SDD detector. Dr. Haigh discusses some of the applications of the instrument for her work involving the characterization of nanoparticles, nanoprecipitates in metals and device structures using TEM. Interview filmed by SelectScience at EMC 2012.

Tags: EMC, Nanoprecipitation, nanoparticles

Oxford Instruments Inc. Company website

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